Bickford, Jeanne
12  Ergebnisse:
Personensuche X
?
1

Yield Improvement by Local Wiring Redundancy:

, In: Proceedings of the 7th International Symposium on Quality Electronic Design,
Bickford, Jeanne ; Hibbeler, Jason ; Buhler, Markus... - p. 473-478 , 2006
 
?
2

Editorial:

Bickford, Jeanne P. ; Djurdjanovic, Dragan ; Natarajan, Mahadeva Iyer
IEEE Transactions on Semiconductor Manufacturing.  37 (2024)  1 - p. 2-2 , 2024
 
?
3

Guest Editorial Special Section on the 2022 SEMI Advanced S..:

Bickford, Jeanne Paulette ; Patterson, Oliver D. ; Le Cunff, Delphine...
IEEE Transactions on Semiconductor Manufacturing.  36 (2023)  3 - p. 307-310 , 2023
 
?
4

Terminal metal inspection yield improvement YE: Yield enhan..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Bickford, Jeanne P. - p. 222-225 , 2017
 
?
5

Method and structure to reduce leakage for ESD device: ET/I..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
?
8

Priority research needs to inform amphibian conservation in..:

Campbell Grant, Evan H ; Amburgey, Staci M ; Gratwicke, Brian...
https://kar.kent.ac.uk/102147/3/Conservat%20Sci%20and%20Prac%20-%202023%20-%20Campbell%20Grant.pdf.  , 2023
 
1-12