Bierschenk, T.
46  Ergebnisse:
Personensuche X
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1

Characterisation of silicon oxynitride thin films and their..:

Mota-Santiago, P ; Nadzri, A ; Kremer, F...
Journal of Physics D: Applied Physics.  55 (2022)  14 - p. 145301 , 2022
 
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2

Determination of track radii and relation to the electronic..:

Wesch, W. ; Rensberg, J. ; Bierschenk, T....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  485 (2020)  - p. 50-56 , 2020
 
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5

Size characterization of ion tracks in PET and PTFE using S..:

Schauries, D. ; Rodriguez, M.D. ; Afra, B....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  365 (2015)  - p. 573-577 , 2015
 
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6

SAXS and TEM investigation of ion tracks in neodymium-doped..:

Rodriguez, M.D. ; Li, W.X. ; Chen, F....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  326 (2014)  - p. 150-153 , 2014
 
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7

Annealing behaviour of ion tracks in olivine, apatite and b..:

Afra, B. ; Lang, M. ; Bierschenk, T....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  326 (2014)  - p. 126-130 , 2014
 
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8

Effect of electronic energy loss on ion track formation in ..:

Bierschenk, T. ; Afra, B. ; Rodriguez, M.D....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  326 (2014)  - p. 113-116 , 2014
 
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11

The shape of ion tracks in natural apatite:

Schauries, D. ; Afra, B. ; Bierschenk, T....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  326 (2014)  - p. 117-120 , 2014
 
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12

Latent ion tracks in amorphous silicon:

, In: Physical review / publ. for the American Physical Society by the American Institute of Physics
Bierschenk, T. ; Giulian, R. ; Afra, B..... (2013)  17 - p. 174111
Exemplare:  Zentrale:Magazinturm-E02 15z phy 865 jc/711; Zentrale:Magazin Zs fb 9711
 
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14

Latent ion tracks in amorphous silicon:

Bierschenk, T. ; Giulian, R. ; Afra, B....
Physical Review B.  88 (2013)  17 - p. , 2013
 
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