E-LIB Suche - Ergebnisse für: Bleuet, Pierre

1

NEAR-INFRARED LIGHT APPLIED TO THE BRAIN: A STUDY OF PHOTON..:

Dole, Marjorie ; Auboiroux, Vincent ; Bleuet, Pierre..
IBRO Neuroscience Reports. 15 (2023) - p. S776-S777 , 2023

Link: https://doi.org/10.1016/..

2

TomoPress—In Situ Synchrotron-Based Microtomography under A..:

Rack, Alexander ; Stroebel, Johannes ; Rack, Tatjana...
Instruments. 4 (2020) 2 - p. 11 , 2020

Link: https://doi.org/10.3390/..

3

Meso-photonic Detection with HgCdTe APDs at High Count Rate:

Rothman, Johan ; Pes, Salvatore ; Bleuet, Pierre...
Journal of Electronic Materials. 49 (2020) 11 - p. 6881-6892 , 2020

Link: https://doi.org/10.1007/..

4

Corrigendum to '3D phase mapping of solid oxide fuel cell Y..:

Villanova, Julie ; Laurencin, Jérôme ; Cloetens, Peter...
Journal of Power Sources. 382 (2018) - p. 199 , 2018

Link: https://doi.org/10.1016/..

5

2D/3D Microanalysis by Energy Dispersive X-ray Absorption S..:

Sanchez, Dario Ferreira ; Simionovici, Alexandre S. ; Lemelle, Laurence...
Scientific Reports. 7 (2017) 1 - p. , 2017

Link: https://doi.org/10.1038/..

6

A 2D and 3D X-ray μ-diffraction and μ-fluorescence study of..:

Sanchez, Dario Ferreira ; Grolimund, Daniel ; Hubert, Maxime..
International Journal of Hydrogen Energy. 42 (2017) 2 - p. 1203-1211 , 2017

Link: https://doi.org/10.1016/..

7

In-situ X-ray μLaue diffraction study of copper through-sil..:

Sanchez, Dario Ferreira ; Reboh, Shay ; Weleguela, Monica Larissa Djomeni...
Microelectronics Reliability. 56 (2016) - p. 78-84 , 2016

Link: https://doi.org/10.1016/..

8

State-of-the-Art Three-Dimensional Chemical Characterizatio..:

Priebe, Agnieszka ; Bleuet, Pierre ; Goret, Gael...
Microscopy and Microanalysis. 22 (2016) 6 - p. 1261-1269 , 2016

Link: https://doi.org/10.1017/..

9

Self-adapting denoising, alignment and reconstruction in el..:

Printemps, Tony ; Mula, Guido ; Sette, Daniele...
Ultramicroscopy. 160 (2016) - p. 23-34 , 2016

Link: https://doi.org/10.1016/..

10

Non‐rigid alignment in electron tomography in materials sci..:

PRINTEMPS, TONY ; BERNIER, NICOLAS ; BLEUET, PIERRE..
Journal of Microscopy. 263 (2016) 3 - p. 312-319 , 2016

Link: https://doi.org/10.1111/..

11

X-ray micro Laue diffraction tomography analysis of a solid..:

Ferreira Sanchez, Dario ; Villanova, Julie ; Laurencin, Jérôme...
Journal of Applied Crystallography. 48 (2015) 2 - p. 357-364 , 2015

Link: https://doi.org/10.1107/..

12

Understanding the Operating Mechanisms of Mixed Ionic Elect..:

Hubert, Maxime ; Laurencin, Jérôme ; Cloetens, Peter...
ECS Transactions. 68 (2015) 1 - p. 609-621 , 2015

Link: https://doi.org/10.1149/..

13

3D spatial resolution improvement by dual-axis electron tom..:

Haberfehlner, Georg ; Serra, Raphaël ; Cooper, David..
Ultramicroscopy. 136 (2014) - p. 144-153 , 2014

Link: https://doi.org/10.1016/..

14

X-ray μ-Laue diffraction analysis of Cu through-silicon via..:

Sanchez, Dario Ferreira ; Laloum, David ; Weleguela, Monica Larissa Djomeni...
Journal of Applied Physics. 116 (2014) 16 - p. , 2014

Link: https://doi.org/10.1063/..

15

Multi-scale 3D imaging of absorbing porous materials for so..:

Villanova, Julie ; Cloetens, Peter ; Suhonen, Heikki...
Journal of Materials Science. 49 (2014) 16 - p. 5626-5634 , 2014

Link: https://doi.org/10.1007/..