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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
7
A novel test structure with two active areas for eNVM relia..:
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2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) ,
11
Towards Printed Conductive-Bridge Memory Devices Based on M..:
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Applications of Data Assimilation and Inverse Problems in the Earth Sciences ,
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