Bohuslavskyi, H
30  Ergebnisse:
Personensuche X
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1

Gate reflectometry for probing charge and spin states in li..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Hutin, L. ; Lundberg, T. ; Chatterjee, A.... - p. 37.7.1-37.7.4 , 2019
 
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2

Cryogenic Characterization of 28-nm FD-SOI Ring Oscillators..:

Bohuslavskyi, H. ; Barraud, S. ; Barral, V....
IEEE Transactions on Electron Devices.  65 (2018)  9 - p. 3682-3688 , 2018
 
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3

A CMOS silicon spin qubit:

Maurand, R. ; Jehl, X. ; Kotekar-Patil, D....
Nature Communications.  7 (2016)  1 - p. , 2016
 
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15

Si MOS technology for spin-based quantum computing:

Hutin, L ; Bertrand, B ; Maurand, R...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ESSDERC.2018.8486863.  , 2018
 
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