Boige, F.
62  Ergebnisse:
Personensuche X
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1

SiC MOSFETs soft and hard failure modes: functional analysi..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Richardeau, F. ; Boige, F. ; Castellazzi, A.... - p. 170-173 , 2020
 
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3

SiC power MOSFET in short-circuit operation: Electro-therma..:

Boige, F. ; Richardeau, F. ; Lefebvre, S..
Mathematics and Computers in Simulation.  158 (2019)  - p. 375-386 , 2019
 
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4

Circuit-type modelling of SiC power Mosfet in short-circuit..:

Richardeau, F. ; Boige, F.
Microelectronics Reliability.  100-101 (2019)  - p. 113501 , 2019
 
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5

Ensure an original and safe "fail-to-open" mode in planar a..:

Boige, F. ; Richardeau, F. ; Lefebvre, S....
Microelectronics Reliability.  88-90 (2018)  - p. 598-603 , 2018
 
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7

Gate leakage-current analysis and modelling of planar and t..:

Boige, F. ; Richardeau, F.
Microelectronics Reliability.  76-77 (2017)  - p. 532-538 , 2017
 
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12

Codon-specific KRAS mutations predict survival in advanced ..:

Boilève, A. ; Rousseau, A. ; Hilmi, M....
ESMO Gastrointestinal Oncology.  3 (2024)  - p. 100030 , 2024
 
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13

Jet-entrainment sampling: A new method for extracting parti..:

Michelsen, Hope A. ; Boigné, Emeric ; Schrader, Paul E....
Proceedings of the Combustion Institute.  39 (2023)  1 - p. 847-855 , 2023
 
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14

Is intra-arterial hepatic chemotherapy painful?:

Kerbage, F. ; Grinda, T. ; Smolenschi, C....
Supportive Care in Cancer.  28 (2020)  10 - p. 4585-4587 , 2020
 
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