Bonnafé, J.
528  Ergebnisse:
Personensuche X
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1

Physica status solidi 

Volume 87, Number 2: February 16  Physica status solidi ; Volume 87, Number 2, A
Akonov, D. A ; Akselrod, M. S ; Amelinckx, S... - Reprint 2021 . , [2022]
 
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2

Physica status solidi 

Volume 73, Number 2: October 16  Physica status solidi ; Volume 73, Number 2, A
Abou-Saif, E. A ; Ahmed, M. A ; Akkerman, A. F... - Reprint 2021 . , [2022]
 
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3

Physica status solidi 

Volume 76, Number 2: April 16  Physica status solidi ; Volume 76, Number 2, A
Abdeen, A. M ; Abdel-Kader, M. M ; Abdel-Malik, T. G... - Reprint 2021 . , [2022]
 
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4

Physica status solidi 

Volume 77, Number 1: May 16  Physica status solidi ; Volume 77, Number 1, A
Abdelmoula, K ; Agamalyan, N. R ; Alekhin, A. A... - Reprint 2021 . , [2022]
 
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5

Physica status solidi 

Volume 72, Number 1: July 16  Physica status solidi ; Volume 72, Number 1, A
Abdeen, A ; Abell, J ; Akhmetov, V... - Reprint 2021 . , [2022]
 
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7

Micro-optomechanical sensor for optical connection in the n..:

Belier, B. ; Santoso, A. ; Bonnafe, J....
Applied Physics Letters.  77 (2000)  12 - p. 1768-1770 , 2000
 
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10

Photon tunneling from semiconductor surfaces to atomic forc..:

Fillard, J.P. ; Castagné, M. ; Prioleau, C....
Materials Science and Engineering: B.  28 (1994)  1-3 - p. 493-496 , 1994
 
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11

A comparison of the thermal and near band-gap light-induced..:

Alvarez, A. ; Jiménez, J. ; Chafai, M...
Journal of Applied Physics.  73 (1993)  10 - p. 5004-5008 , 1993
 
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12

Photocurrent study of the influence of photogenerated carri..:

Chafai, M. ; Jiménez, J. ; Alvárez, A..
Applied Physics Letters.  60 (1992)  10 - p. 1253-1255 , 1992
 
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13

Qualification by optical means of CdTe substrates:

Triboulet, R. ; Durand, A. ; Gall, P....
Journal of Crystal Growth.  117 (1992)  1-4 - p. 227-232 , 1992
 
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14

Laser-scanning tomography: a survey of recent investigation..:

Fillard, J P ; Gall, P ; Bonnafe, J..
Semiconductor Science and Technology.  7 (1992)  1A - p. A283-A287 , 1992
 
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15

Recognition and mapping of microdefects by photoetching, la..:

Weyher, J L ; Gall, P ; Dang, Le Si...
Semiconductor Science and Technology.  7 (1992)  1A - p. A45-A52 , 1992
 
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