Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Breil, N.
114  Ergebnisse:
Personensuche X
?
1

Contact Cavity Shaping and Selective SiGe:B Low-Temperature..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Breil, N. ; Lee, B-C. ; Avendano, J. Avila... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
?
2

Demonstration of a Multi-Level μA-Range Bulk Switching ReRA..:

, In: 2022 International Electron Devices Meeting (IEDM),
Wu, Y. ; Cai, F. ; Thomas, L.... - p. 18.4.1-18.4.4 , 2022
Link: https://doi.org/10.1109/..
 
?
3

Investigation of reoxidation mechanisms in nitrided tunnel ..:

Breil, N. ; Cassagnard, L. ; Arsac, C...
Microelectronic Engineering.  88 (2011)  7 - p. 1186-1188 , 2011
Link: https://doi.org/10.1016/..
 
?
4

An electrical evaluation method for the silicidation of sil..:

Tang, X. ; Reckinger, N. ; Bayot, V....
Applied Physics Letters.  95 (2009)  2 - p. , 2009
Link: https://doi.org/10.1063/..
 
?
5

Transmission electron microscopy study of the platinum germ..:

Łaszcz, A. ; Ratajczak, J. ; Czerwinski, A....
Materials Science and Engineering: B.  154-155 (2008)  - p. 175-178 , 2008
Link: https://doi.org/10.1016/..
 
?
6

TEM Study of the Silicidation Process in Pt/Si and Ir/Si St..:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007,
Łaszcz, A ; Ratajczak, J ; Czerwinski, A... - p. 337-340 , 2008
Link: https://doi.org/10.1007/..
 
?
7

Impact of channel doping on Schottky barrier height and inv..:

Larrieu, G. ; Dubois, E. ; Yarekha, D....
Materials Science and Engineering: B.  154-155 (2008)  - p. 159-162 , 2008
Link: https://doi.org/10.1016/..
 
?
8

Recent advances in metallic source/drain MOSFETs:

, In: Extended Abstracts - 2008 8th International Workshop on Junction Technology (IWJT '08),
Dubois, E. ; Larrieu, G. ; Breil, N.... - p. None , 2008
Link: https://doi.org/10.1109/..
 
?
9

An Original Selective Etch of Pt vs. PtSi using a Low Tempe..:

Breil, N. ; Halimaoui, A. ; Dubois, E....
ECS Transactions.  6 (2007)  1 - p. 459-465 , 2007
Link: https://doi.org/10.1149/..
 
?
10

Selective etching of Pt with respect to PtSi using a sacrif..:

Breil, N. ; Halimaoui, A. ; Skotnicki, T....
Applied Physics Letters.  91 (2007)  23 - p. , 2007
Link: https://doi.org/10.1063/..
 
?
11

TEM study of PtSi contact layers for low Schottky barrier M..:

Łaszcz, A. ; Kątcki, J. ; Ratajczak, J....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  253 (2006)  1-2 - p. 274-277 , 2006
Link: https://doi.org/10.1016/..
 
?
12

Poly-Si gate engineering for advanced CMOS transistors by g..:

Bourdon, H. ; Juhel, M. ; Oudet, B...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  237 (2005)  1-2 - p. 148-154 , 2005
Link: https://doi.org/10.1016/..
 
?
13

К вопросу об обеспечении информационно-технологической безо..:

Зайцева, С. А ; Брейль, Н. А ; Zaitseva, S. A.
30 лет Конвенции о правах ребенка: современные вызовы и пути решения проблем в сфере защиты прав детей. - Екатеринбург, 2020.  , 2020
Link: https://elar.rsvpu.ru/ha..
 
?
14

PMOS contact resistance solution compatible to CMOS integra..:

Ni, C-N ; Huang, Y-C ; Jun, S...
https://scholarcommons.scu.edu/elec/117.  , 2016
Link: https://scholarcommons.s..
 
?
15

An electrical evaluation method for the silicidation of sil..:

Tang, Xiaohui ; Flandre, Denis ; Reckinger, Nicolas...
boreal:35467.  , 2009
Link: http://hdl.handle.net/20..
 
1-15