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2023 IEEE International Symposium on Circuits and Systems (ISCAS) ,
1
Impact on Radiation Robustness of Gate Mapping in FinFET Ci..:
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2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ,
2
A MCU-robust Interleaved Data/Detection SRAM for Space Envi..:
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2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS) ,
4
A Tool for Automatic Radiation-Hardened SRAM Layout Generat..:
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2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI) ,
5
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM A..:
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2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
6
An SRAM-based Multiple Event Upsets Detection Method for Sp..:
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2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS) ,
7
Voltage Scaling Influence on the Soft Error Susceptibility ..:
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2020 IEEE Latin-American Test Symposium (LATS) ,
8
Work-Function Fluctuation Impact on the SET Response of Fin..:
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2020 IEEE Latin-American Test Symposium (LATS) ,
9
Circuit Level Design Methods to Mitigate Soft Errors:
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IFIP Advances in Information and Communication Technology; VLSI-SoC: New Technology Enabler ,
10
Process Variability Impact on the SET Response of FinFET Mu..:
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2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) ,
11
Evaluation of SET under Process Variability on FinFET Multi..:
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2021 IEEE 22nd Latin American Test Symposium (LATS) ,
13
Exploring Gate Mapping and Transistor Sizing to Improve Rad..:
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