E-LIB Suche - Ergebnisse für: Breternitz, Volkmar

1

Recalibration-free measurement of the compound layer thickn..:

, In: Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]

Wilke, Marcus ; Analytis, Minas ; Breternitz, Volkmar... (2006) - p. 319-320

Exemplar: Zentrale:Magazin 01.R.9827

2

Zinc oxide - unique material for micro-/nanotechnology:

, In: Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]

Flickyngerova, Sona ; Novotny, Ivan ; Tvarozek, Vladimir.... (2006) - p. 309-310

Exemplar: Zentrale:Magazin 01.R.9827

3

Silicon wafer residual stresses determination by evaluating..:

, In: [Vortragsreihen

Vaněk, Oldrich ; Hučko, B. ; Držik, M... (1999) - p. 404-408

Exemplar: Zentrale:Magazin 01.h.1069-2

4

Thin film microelectrode arrays for electrochemical biosens..:

, In: [Vortragsreihen

Novotny, I. ; Breternitz, Volkmar ; Ivanic, R..... (1999) - p. 215-220

Exemplar: Zentrale:Magazin 01.h.1069-1

5

Zinc oxide - Unique material for micro- /nanotechnology:

Flickyngerova, Sona ; Novotny, Ivan ; Tvarozek, Vladimir...
Information technology and electrical engineering - devices and systems, materials and technologies for the future -- 51. IWK, Internationales Wissenschaftliches Kolloquium. , 2009

Link: https://www.db-thueringe..

6

Recalibration-free measurement of the compound layer thickn..:

Wilke, Marcus ; Analytis, Minas ; Breternitz, Volkmar..
Information technology and electrical engineering - devices and systems, materials and technologies for the future -- 51. IWK, Internationales Wissenschaftliches Kolloquium. , 2009

Link: https://www.db-thueringe..