Personensuche
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Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]
1
Recalibration-free measurement of the compound layer thickn..:
, In:Exemplar:
Zentrale:Magazin 01.R.9827
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Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]
2
Zinc oxide - unique material for micro-/nanotechnology:
, In:Exemplar:
Zentrale:Magazin 01.R.9827
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[Vortragsreihen
3
Silicon wafer residual stresses determination by evaluating..:
, In:Exemplar:
Zentrale:Magazin 01.h.1069-2
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[Vortragsreihen
4
Thin film microelectrode arrays for electrochemical biosens..:
, In:Exemplar:
Zentrale:Magazin 01.h.1069-1