Breugelmans, Robbe
7  Ergebnisse:
Personensuche X
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3

Why and how to adapt PID testing for bifacial PV modules?:

Carolus, Jorne ; Breugelmans, Robbe ; Tsanakas, John A....
Progress in Photovoltaics: Research and Applications.  28 (2020)  10 - p. 1045-1053 , 2020
 
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On The Susceptibility of PID in Perovskite Modules: A Compa..:

BREUGELMANS, Robbe ; MERCKX, Tamara ; AGUIRRE, Aranzazu...
[1] Carolus, J., Merckx, T., Purohit, Z., Tripathi, B., Boyen, H.-G.G., Aernouts, T., De Ceuninck, W., Conings, B., Daenen, M., 2019. Potential‐Induced Degradation and Recovery of Perovskite Solar Cells. Sol. RRL 3, 1900226. [2] Brecl, K., Jošt, M., Bokalič, M., Ekar, J., Kovač, J., Topič, M., 2021. Are Perovskite Solar Cell Potential-Induced Degradation Proof? Sol. RRL 2100815. [3] Purohit, Z., Song, W., Carolus, J., Chaliyawala, H., Lammar, S., Merckx, T., Aernouts, T., Tripathi, B., Daenen, M., 2021. Impact of Potential-Induced Degradation on Different Architecture-Based Perovskite Solar Cells. Sol. RRL 5, 2100349..  , 2022
 
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Potential-Induced Degradation of the Shunting Type: on the ..:

BREUGELMANS, Robbe ; CAROLUS, Jorne ; VAN DER HEIDE, Arvid..
[1] S. Pingel, O. Frank, M. Winkler, S. Oaryan, T. Geipel, H. Hoehne, and J. Berghold, "Potential induced degradation of solar cells and panels," in Conference Record of the IEEE Photovoltaic Specialists Conference, 2010, pp. 2817–2822, doi:10.1109/PVSC.2010.5616823. [2] V. Naumann, D. Lausch, A. Hähnel, J. Bauer, O. Breitenstein, A. Graff, M. Werner, S. Swatek, S. Großer, J. Bagdahn, and C. Hagendorf, "Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells," Sol. Energy Mater. Sol. Cells, 2014, doi:10.1016/j.solmat.2013.06.015. [3] W. Luo, Y. S. Khoo, P. Hacke, V. Naumann, D. Lausch, S. P. Harvey, J. P. Singh, J. Chai, Y. Wang, A. G. Aberle, and S. Ramakrishna, "Potential-induced degradation in photovoltaic modules: A critical review," Energy and Environmental Science, vol. 10, no. 1. Royal Society of Chemistry, pp. 43–68, Jan. 01, 2017, doi:10.1039/c6ee02271e. [4] P. Hacke, R. Smith, K....  , 2022
 
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