Breuil, L.
2078  Ergebnisse:
Personensuche X
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1

Gate Side Injection Operating Mode for 3D NAND Flash Memori..:

, In: 2024 IEEE International Memory Workshop (IMW),
Breuil, L. ; Izmailov, R. ; Popovici, M.... - p. 1-4 , 2024
 
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2

Investigation of the Impact of Ferroelectricity Boosted Gat..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Higashi, Y. ; Bastos, J. P. ; Chasin, A.... - p. 1-6 , 2024
 
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4

Enabling 3D NAND Trench Cells for Scaled Flash Memories:

, In: 2023 IEEE International Memory Workshop (IMW),
Rachidi, S. ; Ramesh, S. ; Breuil, L.... - p. 1-4 , 2023
 
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6

Optimization of Retention in Ferroelectricity Boosted Gate ..:

, In: 2023 IEEE International Memory Workshop (IMW),
Breuil, L. ; Popovici, M. ; Stiers, J.... - p. 1-4 , 2023
 
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9

Understanding the kinetics of Metal Induced Lateral Crystal..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ramesh, S. ; Palayam, S. Vadakupudhu ; Ajaykumar, A.... - p. 10.2.1-10.2.4 , 2021
 
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10

First demonstration of ferroelectric Si:HfO2 based 3D FE-FE..:

, In: 2021 IEEE International Memory Workshop (IMW),
Banerjee, K. ; Breuil, L. ; Milenin, A.P.... - p. 1-4 , 2021
 
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12

Impact du diagnostic moléculaire rapide dans la prise en ch..:

Belkacem, A. ; Diallo, K. ; Medina, F....
Médecine et Maladies Infectieuses.  50 (2020)  6 - p. S105 , 2020
 
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13

Integration of Ruthenium-based Wordline in a 3-D NAND Memor..:

, In: 2020 IEEE International Memory Workshop (IMW),
Breuil, L. ; El Hajjam, G. K. ; Ramesh, S.... - p. 1-4 , 2020
 
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14

Defect profiling in FEFET Si:HfO2 layers:

O'Sullivan, B. J. ; Putcha, V. ; Izmailov, R....
Applied Physics Letters.  117 (2020)  20 - p. , 2020
 
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