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Briggs, B
4500  Ergebnisse:
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1

Forksheet FETs with Bottom Dielectric Isolation, Self-Align..:

, In: 2022 International Electron Devices Meeting (IEDM),
Mertens, H. ; Ritzenthaler, R. ; Oniki, Y.... - p. 23.1.1-23.1.4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Scaled FinFETs Connected by Using Both Wafer Sides for Rout..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Veloso, A. ; Jourdain, A. ; Radisic, D.... - p. 284-285 , 2022
Link: https://doi.org/10.1109/..
 
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3

Inspection and metrology challenges for 3 nm node devices a..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Shohjoh, T. ; Ikota, M. ; Isawa, M.... - p. 3.3.1-3.3.4 , 2021
Link: https://doi.org/10.1109/..
 
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4

Comparison of Electrical Performance of Co-Integrated Forks..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ritzenthaler, R. ; Mertens, H. ; Eneman, G.... - p. 26.2.1-26.2.4 , 2021
Link: https://doi.org/10.1109/..
 
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5

Buried Power Rail Integration with Si FinFETs for CMOS Scal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Gupta, A. ; Mertens, H. ; Tao, Z.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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6

First Monolithic Integration of 3D Complementary FET (CFET)..:

, In: 2020 IEEE Symposium on VLSI Technology,
Subramanian, S. ; Hosseini, M. ; Chiarella, T.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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7

Three-Layer BEOL Process Integration with Supervia and Self..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Vega-Gonzalez, V. ; Bekaert, J. ; Kesters, E.... - p. 19.3.1-19.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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8

PROVIDING RURAL VETERANS ACCESS TO GEROFIT THROUGH CLINICAL..:

Briggs, B ; Jain, C ; C Morey, Miriam...
Innovation in Aging.  2 (2018)  suppl_1 - p. 3-3 , 2018
Link: https://doi.org/10.1093/..
 
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9

Integral Benchmark Data for Nuclear Data Testing Through th..:

Briggs, J.B. ; Bess, J.D. ; Gulliford, J.
Nuclear Data Sheets.  118 (2014)  - p. 396-400 , 2014
Link: https://doi.org/10.1016/..
 
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10

Identification of Possible Discrepancies in HEU Metal Bench..:

Bess, J.D. ; Briggs, J.B. ; Marshall, M.A.
Nuclear Data Sheets.  118 (2014)  - p. 466-468 , 2014
Link: https://doi.org/10.1016/..
 
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11

Characterization of hafnium oxide resistive memory layers d..:

Briggs, B.D. ; Bishop, S.M. ; Leedy, K.D..
Thin Solid Films.  562 (2014)  - p. 519-524 , 2014
Link: https://doi.org/10.1016/..
 
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12

Influence of the plasma oxidation power on the switching pr..:

McDonald, N.R. ; Bishop, S.M. ; Briggs, B.D...
Solid-State Electronics.  78 (2012)  - p. 46-50 , 2012
Link: https://doi.org/10.1016/..
 
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13

P32.07: Ultrasound elastography in normal pregnant cervixes..:

Donnelly, M. ; Briggs, B. ; Muench, M...
Ultrasound in Obstetrics & Gynecology.  40 (2012)  S1 - p. 303-303 , 2012
Link: https://doi.org/10.1002/..
 
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14

P32.04: Development of techniques to allow semi‐quantitativ..:

Donnelly, M. ; Briggs, B. ; Barbera, A..
Ultrasound in Obstetrics & Gynecology.  40 (2012)  S1 - p. 302-302 , 2012
Link: https://doi.org/10.1002/..
 
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15

Microbial community distribution in sediments from the Moun..:

Colwell, F. ; Schwartz, A. ; Briggs, B.
Marine and Petroleum Geology.  28 (2011)  2 - p. 404-410 , 2011
Link: https://doi.org/10.1016/..
 
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