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2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) ,
1
Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-A..:
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2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) ,
3
Small Area, High Accuracy Sub-Radix Resistive Current Mode ..:
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2022 IEEE 40th VLSI Test Symposium (VTS) ,
4
The Least-Squares Approach to Systematic Error Identificati..:
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2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
5
Cross-Correlation Approach to Detecting Issue Test Sites in..:
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2022 IEEE International Test Conference (ITC) ,
6
Optimal Order Polynomial Transformation for Calibrating Sys..:
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2022 IEEE European Test Symposium (ETS) ,
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