Bruchhaus, L.
407  Ergebnisse:
Personensuche X
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2

Advanced Ion Source Technology for High Resolution and Stab..:

Bauerdick, S. ; Sanabia, J. E. ; Mazarov, P....
Microscopy and Microanalysis.  20 (2014)  S3 - p. 312-313 , 2014
 
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3

FIB carving of nanopores into suspended graphene films:

Morin, A. ; Lucot, D. ; Ouerghi, A....
Microelectronic Engineering.  97 (2012)  - p. 311-316 , 2012
 
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7

Challenges and Opportunities for Focused Ion Beam Processin..:

Gierak, J ; Schiedt, B ; Lucot, D...
Microscopy and Microanalysis.  15 (2009)  S2 - p. 320-321 , 2009
 
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9

Sub-5nm FIB direct patterning of nanodevices:

Gierak, J. ; Madouri, A. ; Biance, A.L....
Microelectronic Engineering.  84 (2007)  5-8 - p. 779-783 , 2007
 
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10

Towards the creation of quantum dots using FIB technology:

Kitslaar, P. ; Strassner, M. ; Sagnes, I....
Microelectronic Engineering.  83 (2006)  4-9 - p. 811-814 , 2006
 
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12

Exploration of the ultimate patterning potential achievable..:

Gierak, J. ; Bourhis, E. ; Mérat Combes, M.N....
Microelectronic Engineering.  78-79 (2005)  - p. 266-278 , 2005
 
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13

Characterization of thermal device properties with nanomete..:

Cramer, R.M. ; Bruchhaus, L. ; Balk, L.J.
Microelectronics Reliability.  37 (1997)  10-11 - p. 1583-1586 , 1997
 
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14

Nano-FIB from Research to Applications — a European Scalpel..:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007,
Gierak, J ; Madouri, A ; Biance, A L... - p. 431-440 ,
 
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