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Bubulac, L.O.
55  Ergebnisse:
Personensuche X
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1

Defects and the Formation of Impurity 'Hot Spots' in HgCdTe..:

Benson, J. D. ; Bubulac, L. O. ; Jacobs, R. N....
Journal of Electronic Materials.  48 (2019)  10 - p. 6194-6202 , 2019
Link: https://doi.org/10.1007/..
 
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2

Impurity 'Hot Spots' in MBE HgCdTe/CdZnTe:

Benson, J. D. ; Bubulac, L. O. ; Wang, A....
Journal of Electronic Materials.  47 (2018)  10 - p. 5671-5679 , 2018
Link: https://doi.org/10.1007/..
 
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3

Impact of CdZnTe Substrates on MBE HgCdTe Deposition:

Benson, J. D. ; Bubulac, L. O. ; Jaime-Vasquez, M....
Journal of Electronic Materials.  46 (2017)  9 - p. 5418-5423 , 2017
Link: https://doi.org/10.1007/..
 
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4

Analysis of Etched CdZnTe Substrates:

Benson, J. D. ; Bubulac, L. O. ; Jaime-Vasquez, M....
Journal of Electronic Materials.  45 (2016)  9 - p. 4502-4510 , 2016
Link: https://doi.org/10.1007/..
 
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5

As-Received CdZnTe Substrate Contamination:

Benson, J. D. ; Bubulac, L. O. ; Jaime-Vasquez, M....
Journal of Electronic Materials.  44 (2015)  9 - p. 3082-3091 , 2015
Link: https://doi.org/10.1007/..
 
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6

Impact of Tellurium Precipitates in CdZnTe Substrates on MB..:

Benson, J. D. ; Bubulac, L. O. ; Smith, P. J....
Journal of Electronic Materials.  43 (2014)  11 - p. 3993-3998 , 2014
Link: https://doi.org/10.1007/..
 
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7

Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrat..:

Benson, J. D. ; Bubulac, L. O. ; Lennon, C. M....
Journal of Electronic Materials.  42 (2013)  11 - p. 3217-3223 , 2013
Link: https://doi.org/10.1007/..
 
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8

Growth and Analysis of HgCdTe on Alternate Substrates:

Benson, J.D. ; Bubulac, L.O. ; Smith, P.J....
Journal of Electronic Materials.  41 (2012)  10 - p. 2971-2974 , 2012
Link: https://doi.org/10.1007/..
 
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9

Microstructural Characterization of CdTe(211)B/ZnTe/Si(211)..:

ZHAO, W. F. ; JACOBS, R. N. ; JAIME-VASQUEZ, M...
Journal of Electronic Materials.  40 (2011)  8 - p. 1733-1737 , 2011
Link: https://doi.org/10.1007/..
 
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10

Dislocation Analysis in (112)B HgCdTe/CdTe/Si:

Benson, J. D. ; Farrell, S. ; Brill, G....
Journal of Electronic Materials.  40 (2011)  8 - p. 1847-1853 , 2011
Link: https://doi.org/10.1007/..
 
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11

The Distribution Tail of LWIR HgCdTe-on-Si FPAs: a Hypothet..:

Bubulac, L. O. ; Benson, J.D. ; Jacobs, R.N....
Journal of Electronic Materials.  40 (2011)  3 - p. 280-288 , 2011
Link: https://doi.org/10.1007/..
 
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12

Wafer Mapping Using Deuterium Enhanced Defect Characterizat..:

Hossain, K. ; Holland, O.W. ; Hellmer, R....
Journal of Electronic Materials.  39 (2010)  7 - p. 930-935 , 2010
Link: https://doi.org/10.1007/..
 
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13

Characterization of Dislocations in (112)B HgCdTe/CdTe/Si:

Benson, J. D. ; Bubulac, L. O. ; Smith, P. J....
Journal of Electronic Materials.  39 (2010)  7 - p. 1080-1086 , 2010
Link: https://doi.org/10.1007/..
 
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14

Evaluation of Surface Cleaning of Si(211) for Molecular-Bea..:

Jaime-Vasquez, M. ; Jacobs, R. N. ; Benson, J. D....
Journal of Electronic Materials.  39 (2010)  7 - p. 951-957 , 2010
Link: https://doi.org/10.1007/..
 
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15

Topography and Dislocations in (112)B HgCdTe/CdTe/Si:

Benson, J. D. ; Smith, P. J. ; Jacobs, R. N....
Journal of Electronic Materials.  38 (2009)  8 - p. 1771-1775 , 2009
Link: https://doi.org/10.1007/..
 
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