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X
Buiu, O.
46  Ergebnisse:
Personensuche X
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1

Design of a Chemoresistive Sensor Array for Potential Smart..:

, In: 2023 Smart Systems Integration Conference and Exhibition (SSI),
Pachiu, C. ; Simionescu, O. ; Serban, B.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

The influence of the UV and UV-VIS radiation on the hydroph..:

, In: 2022 International Semiconductor Conference (CAS),
Tismanar, I. ; Munteanu, A. ; Andronache, S.... - p. 59-62 , 2022
Link: https://doi.org/10.1109/..
 
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3

Stability of the composite thin films MOx – GO in photocata..:

, In: 2020 International Semiconductor Conference (CAS),
Tismanar, I. ; Bogatu, C. ; Gheorghita, S.... - p. 199-202 , 2020
Link: https://doi.org/10.1109/..
 
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4

Studies for an optimal balancing system for Li ion batterie..:

, In: 2016 International Semiconductor Conference (CAS),
Serbanescu, M. ; Ionescu, O. ; Georgescu, I... - p. 213-216 , 2016
Link: https://doi.org/10.1109/..
 
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5

Substrate impact on optical and microstructural properties ..:

Anastasescu, M. ; Teodorescu, V.S. ; Buiu, O....
Ceramics International.  40 (2014)  8 - p. 11803-11811 , 2014
Link: https://doi.org/10.1016/..
 
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6

Effect of polyethylene glycol on porous transparent TiO2 fi..:

Calderon-Moreno, J.M. ; Preda, S. ; Predoana, L....
Ceramics International.  40 (2014)  1 - p. 2209-2220 , 2014
Link: https://doi.org/10.1016/..
 
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7

Improved vertical MOSFET performance using an epitaxial cha..:

Uchino, T ; Gili, E ; Tan, L...
Semiconductor Science and Technology.  27 (2012)  6 - p. 062002 , 2012
Link: https://doi.org/10.1088/..
 
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8

Damping effects in MEMS resonators:

, In: CAS 2012 (International Semiconductor Conference),
Gologanu, M. ; Bostan, C. G. ; Avramescu, V.. - p. 67-76 , 2012
Link: https://doi.org/10.1109/..
 
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9

Edge current induced failure of semiconductor PN junction d..:

Obreja, V.V.N. ; Codreanu, C. ; Poenar, D..
Microelectronics Reliability.  51 (2011)  3 - p. 536-542 , 2011
Link: https://doi.org/10.1016/..
 
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10

Improved sub-threshold slope in short-channel vertical MOSF..:

Hakim, M.M.A. ; Tan, L. ; Buiu, O....
Solid-State Electronics.  53 (2009)  7 - p. 753-759 , 2009
Link: https://doi.org/10.1016/..
 
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11

Estimate of dielectric density using spectroscopic ellipsom..:

Davey, W. ; Buiu, O. ; Werner, M....
Microelectronic Engineering.  86 (2009)  7-9 - p. 1905-1907 , 2009
Link: https://doi.org/10.1016/..
 
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12

High-k-oxide/silicon interfaces characterized by capacitanc..:

Raeissi, B. ; Piscator, J. ; Engström, O....
Solid-State Electronics.  52 (2008)  9 - p. 1274-1279 , 2008
Link: https://doi.org/10.1016/..
 
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13

Ellipsometric analysis of mixed metal oxides thin films:

Buiu, O. ; Davey, W. ; Lu, Y...
Thin Solid Films.  517 (2008)  1 - p. 453-455 , 2008
Link: https://doi.org/10.1016/..
 
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14

Chemical and optical profiling of ultra thin high-k dielect..:

Bernardini, S. ; MacKenzie, M. ; Buiu, O....
Thin Solid Films.  517 (2008)  1 - p. 459-461 , 2008
Link: https://doi.org/10.1016/..
 
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15

Charge trapping and interface states in hydrogen annealed H..:

Gomeniuk, Y.V. ; Nazarov, A.N. ; Vovk, Ya.N....
Microelectronics Reliability.  47 (2007)  4-5 - p. 714-717 , 2007
Link: https://doi.org/10.1016/..
 
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