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Butola, Rajat
16  Ergebnisse:
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1

Compact Model Build Upon Dynamic Weighting Artificial Neura..:

Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 246-253 , 2024
Link: https://doi.org/10.1109/..
 
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2

Statistical Device Simulation and Machine Learning of Proce..:

Kola, Sekhar Reddy ; Li, Yiming ; Butola, Rajat
IEEE Transactions on Nanotechnology.  23 (2024)  - p. 386-392 , 2024
Link: https://doi.org/10.1109/..
 
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3

Application of long short-term memory modeling technique to..:

Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy..
Computers and Electrical Engineering.  105 (2023)  - p. 108554 , 2023
Link: https://doi.org/10.1016/..
 
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4

A Comprehensive Technique Based on Machine Learning for Dev..:

Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy
IEEE Open Journal of Nanotechnology.  4 (2023)  - p. 181-194 , 2023
Link: https://doi.org/10.1109/..
 
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5

Deep Learning Approach to Estimating Work Function Fluctuat..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy - p. 232-234 , 2022
Link: https://doi.org/10.1109/..
 
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6

Estimating the Process Variation Effects of Stacked Gate Al..:

, In: 2022 IEEE 22nd International Conference on Nanotechnology (NANO),
Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy.. - p. 170-173 , 2022
Link: https://doi.org/10.1109/..
 
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7

A Machine Learning Approach to Modeling Intrinsic Parameter..:

Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy
IEEE Access.  10 (2022)  - p. 71356-71369 , 2022
Link: https://doi.org/10.1109/..
 
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8

Deep Learning Approach to Modeling and Exploring Random Sou..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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9

Machine Learning Approach to Characteristic Fluctuation of ..:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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10

Analytics-statistics mixed training and its fitness to semi..:

Parashar, Parag ; Chen, Chun Han ; Akbar, Chandni...
PLOS ONE.  14 (2019)  8 - p. e0220607 , 2019
Link: https://doi.org/10.1371/..
 
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11

Intelligent Photolithography Corrections Using Dimensionali..:

Parashar, Parag ; Akbar, Chandni ; Rawat, Tejender S....
IEEE Photonics Journal.  11 (2019)  5 - p. 1-15 , 2019
Link: https://doi.org/10.1109/..
 
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12

A Comprehensive Technique Based on Machine Learning for Dev..:

Rajat Butola ; Yiming Li ; Sekhar Reddy Kola
https://ieeexplore.ieee.org/document/10301633/.  , 2023
Link: https://doi.org/10.1109/..
 
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13

A Machine Learning Approach to Modeling Intrinsic Parameter..:

Rajat Butola ; Yiming Li ; Sekhar Reddy Kola
https://ieeexplore.ieee.org/document/9815238/.  , 2022
Link: https://doi.org/10.1109/..
 
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14

Analytics-statistics mixed training and its fitness to semi..:

Parag Parashar ; Chun Han Chen ; Chandni Akbar...
https://doi.org/10.1371/journal.pone.0220607.  , 2019
Link: https://doi.org/10.1371/..
 
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15

Intelligent Photolithography Corrections Using Dimensionali..:

Parag Parashar ; Chandni Akbar ; Tejender S. Rawat...
https://ieeexplore.ieee.org/document/8820144/.  , 2019
Link: https://doi.org/10.1109/..
 
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