Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Cabout, T.
24  Ergebnisse:
Personensuche X
?
1

A Fully Coupled Multi-Physics Model to Simulate Phase Chang..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Miquel, R. ; Cabout, T. ; Cueto, O... - p. 317-320 , 2023
Link: https://doi.org/10.23919..
 
?
2

Hot-carrier reliability and performance study of transistor..:

Devoge, P. ; Aziza, H. ; Lorenzini, P....
Microelectronics Reliability.  138 (2022)  - p. 114699 , 2022
Link: https://doi.org/10.1016/..
 
?
3

Gate-to-drain/source overlap and asymmetry effects on hot-c..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Devoge, P. ; Aziza, H. ; Lorenzini, P.... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
?
4

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P. ; Aziza, H. ; Lorenzini, P....
Microelectronics Reliability.  126 (2021)  - p. 114265 , 2021
Link: https://doi.org/10.1016/..
 
?
5

Bipolar resistive switching from liquid helium to room temp..:

Blonkowski, S ; Cabout, T
Journal of Physics D: Applied Physics.  48 (2015)  34 - p. 345101 , 2015
Link: https://doi.org/10.1088/..
 
?
6

Role of Ti and Pt electrodes on resistance switching variab..:

Cabout, T. ; Buckley, J. ; Cagli, C....
Thin Solid Films.  533 (2013)  - p. 19-23 , 2013
Link: https://doi.org/10.1016/..
 
?
7

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P ; Aziza, Hassen ; Lorenzini, P...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114265.  , 2021
Link: https://hal.science/hal-..
 
?
8

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P ; Aziza, Hassen ; Lorenzini, P...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114265.  , 2021
Link: https://hal.science/hal-..
 
?
9

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P ; Aziza, Hassen ; Lorenzini, P...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114265.  , 2021
Link: https://hal.science/hal-..
 
?
10

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P ; Aziza, Hassen ; Lorenzini, P...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114265.  , 2021
Link: https://hal.science/hal-..
 
?
11

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P ; Aziza, Hassen ; Lorenzini, P...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114265.  , 2021
Link: https://hal.archives-ouv..
 
?
12

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P ; Aziza, Hassen ; Lorenzini, P...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114265.  , 2021
Link: https://hal.science/hal-..
 
?
13

Effect of SET temperature on data retention performances of..:

Cabout, T ; Vianello, E ; Jalaguier, E...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IMW.2014.6849355.  , 2014
Link: https://hal.archives-ouv..
 
?
14

Effect of SET temperature on data retention performances of..:

Cabout, T ; Vianello, E ; Jalaguier, E...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IMW.2014.6849355.  , 2014
Link: https://hal.science/hal-..
 
?
15

Effect of SET temperature on data retention performances of..:

Cabout, T ; Vianello, E ; Jalaguier, E...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IMW.2014.6849355.  , 2014
Link: https://hal.science/hal-..
 
1-15