E-LIB Suche - Ergebnisse für: Camus, Patrick

1

Shortcomings in Low-Energy X-ray Quantification using Propo..:

Camus, Patrick ; Moran, Ken ; Matthews, Michael.
Microscopy and Microanalysis. 30 (2024) Supplement_1 - p. , 2024

Link: https://doi.org/10.1093/..

2

What Does the Proportional Counter Really See: The WDS-SD S..:

Camus, Patrick ; Moran, Ken ; Wuhrer, Richard
Microscopy and Microanalysis. 30 (2024) Supplement_1 - p. , 2024

Link: https://doi.org/10.1093/..

3

The Detector Efficiency Question with EDS:

Eggert, Frank ; Rafaelsen, Jens ; Reinauer, Felix..
Microscopy and Microanalysis. 27 (2021) S1 - p. 1674-1676 , 2021

Link: https://doi.org/10.1017/..

4

Bremsstrahlung Background Modeling Without Fit Regions:

Eggert, Frank ; Camus, Patrick
Microscopy and Microanalysis. 26 (2020) S2 - p. 2178-2180 , 2020

Link: https://doi.org/10.1017/..

5

The Detectors Response of an EDS Spectrometer in Low Energy..:

Eggert, Frank ; Gernert, Ulrich ; Reinauer, Felix.
Microscopy and Microanalysis. 26 (2020) S2 - p. 1552-1553 , 2020

Link: https://doi.org/10.1017/..

6

Blockchain and Initial Coin Offerings: Blockchain's Implica..:

, In: Business Transformation through Blockchain,

Arnold, Laurin ; Brennecke, Martin ; Camus, Patrick... - p. 233-272 , 2018

Link: https://doi.org/10.1007/..

7

Current Status of ISO/TC202 - Microbeam Analysis:

Camus, Patrick ; Meier, Douglas ; Marinenko, Ryna
Microscopy and Microanalysis. 23 (2017) S1 - p. 490-491 , 2017

Link: https://doi.org/10.1017/..

8

EDAX - More Than 50 Years of Influence On Microanalysis:

Camus, Patrick ; Nylese, Tara
Microscopy and Microanalysis. 23 (2017) S1 - p. 1020-1021 , 2017

Link: https://doi.org/10.1017/..

9

Electron imaging with an EBSD detector:

Wright, Stuart I. ; Nowell, Matthew M. ; de Kloe, René..
Ultramicroscopy. 148 (2015) - p. 132-145 , 2015

Link: https://doi.org/10.1016/..

10

Factors Affecting WDS Performance Superiority over EDS:

Camus, Patrick
Microscopy and Microanalysis. 21 (2015) S3 - p. 1629-1630 , 2015

Link: https://doi.org/10.1017/..

11

Improved EBSD Map Fidelity through Re-indexing of Neighbor ..:

Wright, Stuart I. ; Nowell, Matthew M. ; Lindeman, Scott P..
Microscopy and Microanalysis. 21 (2015) S3 - p. 2373-2374 , 2015

Link: https://doi.org/10.1017/..

12

A Comparison of Cross Section Formulas and their Effect on ..:

Sandborg, Alan ; Camus, Patrick ; Hammell, Brent
Microscopy and Microanalysis. 20 (2014) S3 - p. 612-613 , 2014

Link: https://doi.org/10.1017/..

13

Using Accurate Solid Angle Tools when Comparing EDS Detecto..:

Camus, Patrick ; Buchhold, Reinhard
Microscopy and Microanalysis. 20 (2014) S3 - p. 900-901 , 2014

Link: https://doi.org/10.1017/..

14

Impact of 40 Years of Technology Advances on EDS System Per..:

McCarthy, Jon ; Friel, John ; Camus, Patrick
Microscopy and Microanalysis. 15 (2009) 6 - p. 484-490 , 2009

Link: https://doi.org/10.1017/..

15

Methods of Maximizing X-ray Detection in SEMs:

Rohde, David ; Camus, Patrick
Microscopy Today. 15 (2007) 6 - p. 16-17 , 2007

Link: https://doi.org/10.1017/..