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2024 IEEE International Reliability Physics Symposium (IRPS) ,
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Side and Corner Region Non-Uniformities in Grown SiO2 and T..:
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2022 International Electron Devices Meeting (IEDM) ,
3
FinFETs with Thermally Stable RMG Gate Stack for Future DRA..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
4
High Performance Thermally Resistant FinFETs DRAM Periphera..:
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2020 IEEE Symposium on VLSI Technology ,
5
Buried Power Rail Integration with Si FinFETs for CMOS Scal..:
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2020 IEEE Symposium on VLSI Technology ,
6
Addressing Key Challenges for SiGe-pFin Technologies: Fin I..:
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2020 IEEE Symposium on VLSI Technology ,
7
First Monolithic Integration of 3D Complementary FET (CFET)..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
9
Ge oxide scavenging and gate stack nitridation for strained..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
10
Understanding and Physical Modeling Superior Hot-Carrier Re..:
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2019 Compound Semiconductor Week (CSW) ,
11