Capogreco, E.
28  Ergebnisse:
Personensuche X
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1

Side and Corner Region Non-Uniformities in Grown SiO2 and T..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Bastos, J. P. ; O'Sullivan, B. J. ; Higashi, Y.... - p. P36.PI-1-P36.PI-7 , 2024
 
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2

Compact thermally stable high voltage FinFET with 40 nm tox..:

Spessot, A. ; Matagne, P. ; Arimura, H....
Japanese Journal of Applied Physics.  63 (2024)  3 - p. 03SP12 , 2024
 
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3

FinFETs with Thermally Stable RMG Gate Stack for Future DRA..:

, In: 2022 International Electron Devices Meeting (IEDM),
Capogreco, E. ; Arimura, H. ; Ritzenthaler, R.... - p. 26.2.1-26.2.4 , 2022
 
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4

High Performance Thermally Resistant FinFETs DRAM Periphera..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Ritzenthaler, R. ; Capogreco, E. ; Dupuy, E.... - p. 306-307 , 2022
 
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5

Buried Power Rail Integration with Si FinFETs for CMOS Scal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Gupta, A. ; Mertens, H. ; Tao, Z.... - p. 1-2 , 2020
 
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6

Addressing Key Challenges for SiGe-pFin Technologies: Fin I..:

, In: 2020 IEEE Symposium on VLSI Technology,
Arimura, H. ; Capogreco, E. ; Wostyn, K.... - p. 1-2 , 2020
 
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8

TEM investigations of gate-all-around nanowire devices:

Favia, P ; Richard, O ; Eneman, G...
Semiconductor Science and Technology.  34 (2019)  12 - p. 124003 , 2019
 
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9

Ge oxide scavenging and gate stack nitridation for strained..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Arimura, H. ; Wostyn, K. ; Ragnarsson, L.-A.... - p. 29.2.1-29.2.4 , 2019
 
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10

Understanding and Physical Modeling Superior Hot-Carrier Re..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Tyaginov, S. ; Grill, A. ; De Keersgieter, A.... - p. 21.3.1-21.3.4 , 2019
 
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11

Epitaxial Growth of (Si)GeSn Source/Drain Layers for Advanc..:

, In: 2019 Compound Semiconductor Week (CSW),
Loo, R. ; Vohra, A. ; Porret, C.... - p. 1-2 , 2019
 
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13

Abnormalities of ascorbic acid metabolism and diabetic cont..:

Yue, D.K. ; McLennan, S. ; McGill, M....
Diabetes Research and Clinical Practice.  9 (1990)  3 - p. 239-244 , 1990
 
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