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Casse, Mikael
116  Ergebnisse:
Personensuche X
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1

Comprehensive evaluation of gate-induced drain leakage in S..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  214 (2024)  - p. 108865 , 2024
Link: https://doi.org/10.1016/..
 
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2

Comprehensive Evaluation of Junctionless and Inversion-Mode..:

Prates, Rhaycen R. ; Barraud, Sylvain ; Cassé, Mikael...
IEEE Journal of the Electron Devices Society.  , 2024
Link: https://doi.org/10.1109/..
 
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3

Experimental Analysis and Modeling of Self-Heating and Ther..:

Bergamaschi, Flávio Enrico ; Frutuoso, Tadeu Mota ; Paz, Bruna Cardoso...
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2598-2604 , 2024
Link: https://doi.org/10.1109/..
 
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4

FDSOI MOSFET Subthreshold Slope Model Accuracy Improvement ..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Bedecarrats, Thomas ; Triozon, Francois ; Martinie, Sebastien.. - p. 125-128 , 2023
Link: https://doi.org/10.23919..
 
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5

Extraction of Drain Current Variability Components in Junct..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

Low-field Mobility Degradation Factors Temperature Dependen..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Rodrigues, Jaime Calcade ; Casse, Mikael ; Barraud, Sylvain... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

(Invited) Cryogenic Electronics for Quantum Computing ICs: ..:

Casse, Mikael ; Cardoso Paz, Bruna ; Bergamaschi, Flavio...
ECS Transactions.  111 (2023)  1 - p. 149-160 , 2023
Link: https://doi.org/10.1149/..
 
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8

High Temperature and Width Influence on the GIDL of Nanowir..:

De Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 672-680 , 2023
Link: https://doi.org/10.1109/..
 
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9

Experimental assessment of gate-induced drain leakage in SO..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  208 (2023)  - p. 108716 , 2023
Link: https://doi.org/10.1016/..
 
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10

Impact of series resistance on the drain current variabilit..:

da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Cassé, Mikaël...
Solid-State Electronics.  208 (2023)  - p. 108737 , 2023
Link: https://doi.org/10.1016/..
 
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11

Electrical Characterization of Ω-Gate Nanowire MOSFETs Down..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Matos, Jefferson Almeida ; de Souza, Michelly ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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12

Analysis of the Gate-Induced Drain Leakage of SOI Nanowire ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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13

Electrical characteristics of n-type vertically stacked nan..:

Mariniello, Genaro ; Barraud, Sylvain ; Vinet, Maud...
Solid-State Electronics.  194 (2022)  - p. 108337 , 2022
Link: https://doi.org/10.1016/..
 
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14

Electrical characterization of stacked SOI nanowires at low..:

Rodrigues, Jaime C. ; Mariniello, Genaro ; Cassé, Mikael...
Solid-State Electronics.  191 (2022)  - p. 108260 , 2022
Link: https://doi.org/10.1016/..
 
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15

Experimental Comparison of Junctionless and Inversion-Mode ..:

, In: 2022 36th Symposium on Microelectronics Technology (SBMICRO),
Prates, Rhaycen R. ; Barraud, Sylvain ; Casse, Mikael... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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