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2023 14th Spanish Conference on Electron Devices (CDE) ,
4
Effect of Temperature on the Multilevel Properties and Set ..:
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2023 14th Spanish Conference on Electron Devices (CDE) ,
5
Thermal Dependence of the Resistance of TiN/Ti/HfO2/Pt Memr..:
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2023 14th Spanish Conference on Electron Devices (CDE) ,
7
Praseodymium Content Influence on the Resistive Switching E..:
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2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST) ,
11
Empirical Modelling of ReRAM Measured Characteristics Using..:
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2021 13th Spanish Conference on Electron Devices (CDE) ,
15