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Cem Gursoy, Cemil
41  Ergebnisse:
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1

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults i..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Medeiros, Guilherme Cardoso ; Cem Gursoy, Cemil ; Wu, Lizhou... - p. 792-797 , 2020
Link: https://doi.org/10.23919..
 
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2

On BTI Aging Rejuvenation in Memory Address Decoders:

, In: 2022 IEEE 23rd Latin American Test Symposium (LATS),
Gursoy, Cemil Cem ; Kraak, Daniel ; Ahmed, Foisal... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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3

Modeling Soft-Error Reliability Under Variability:

, In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Balakrishnan, Aneesh ; Medeiros, Guilherme Cardoso ; Gursoy, Cemil Cem... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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4

A DFT scheme to improve coverage of hard-to-detect faults i..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Medeiros, Guilherme Cardoso ; Gürsoy, Cemil Cem ; Wu, Lizhou... - p. 792-797 , 2020
Link: https://dl.acm.org/doi/1..
 
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5

Fault emulation on heterogeneous architectures:

, In: 2017 International Conference on Computer Science and Engineering (UBMK),
Yildiz, Abdullah ; Gursoy, Cemil Cem ; Goren, Sezer - p. 905-910 , 2017
Link: https://doi.org/10.1109/..
 
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6

Speeding Up Logic Locking via Fault Emulation and Dynamic M..:

Gören, Sezer ; Gürsoy, Cemil Cem ; Yildiz, Abdullah
Journal of Electronic Testing.  31 (2015)  5-6 - p. 525-536 , 2015
Link: https://doi.org/10.1007/..
 
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7

Erratum to: Speeding Up Logic Locking via Fault Emulation a..:

Gören, Sezer ; Gürsoy, Cemil Cem ; Yildiz, Abdullah
Journal of Electronic Testing.  32 (2015)  1 - p. 105-106 , 2015
Link: https://doi.org/10.1007/..
 
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8

On BTI Aging Rejuvenation in Memory Address Decoders:

Gursoy, Cemil Cem ; Kraak, Daniel ; Ahmed, Foisal...
http://arxiv.org/abs/2212.09356.  , 2022
Link: http://arxiv.org/abs/221..
 
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9

A Rescue Demonstrator for Interdependent Aspects of Reliabi..:

Nevin George ; Guilherme Cardoso Medeiros ; Junchao Chen...
info:eu-repo/grantAgreement/EC/H2020/722325/.  , 2020
Link: https://zenodo.org/recor..
 
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10

On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable ..:

Aleksa Damljanovic ; Giovanni Squillero ; Cemil Cem Gursoy.
info:eu-repo/semantics/altIdentifier/wos/WOS:000521819700063.  , 2019
Link: http://hdl.handle.net/11..
 
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11

High-Level Combined Deterministic and Pseudoexhuastive Test..:

Oyeniran, Adeboye Stephen ; Ubar, Raimund ; Jenihhin, Maksim..
http://arxiv.org/abs/1908.02986.  , 2019
Link: http://arxiv.org/abs/190..
 
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12

RESCUE EDA Toolset for Interdependent Aspects of Reliabilit..:

Cemil Cem Gursoy ; Guilherme Medeiros ; Junchao Chen...
info:eu-repo/grantAgreement/EC/H2020/722325/.  , 2019
Link: https://zenodo.org/recor..
 
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13

Mixed-level identification of fault redundancy in microproc..:

Oyeniran, Adeboye Stephen ; Ubar, Raimund ; Jenihhin, Maksim..
http://arxiv.org/abs/1907.12325.  , 2019
Link: http://arxiv.org/abs/190..
 
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14

On optimization of multi-cycle tests for test quality and a..:

Gursoy, Cemil Cem ; Yildiz, Abdullah ; Goren, Sezer
https://aperta.ulakbim.gov.tr/record/111812.  , 2016
Link: https://aperta.ulakbim.g..
 
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15

Speeding Up Logic Locking via Fault Emulation and Dynamic M..:

Goren, Sezer ; Gursoy, Cemil Cem ; Yildiz, Abdullah
https://aperta.ulakbim.gov.tr/record/76399.  , 2015
Link: https://aperta.ulakbim.g..
 
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