Cerchiara, RR
3  Ergebnisse:
Personensuche X
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2

Nanomilling for Aberration – Corrected TEM and HAADF STEM:

Cerchiara, RR ; Fischione, PE ; Liu, J...
Microscopy and Microanalysis.  15 (2009)  S2 - p. 348-349 , 2009
 
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3

Automated Sample Preparation of Nanoscale Devices for FESEM:

Cerchiara, RR ; Fischione, PE ; Boccabella, MF.
Microscopy and Microanalysis.  15 (2009)  S2 - p. 1076-1077 , 2009
 
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