Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Chao, Calvin Yi-Ping
158  Ergebnisse:
Personensuche X
?
1

Random Telegraph Noise Degradation Caused by Hot Carrier In..:

Chao, Calvin Yi-Ping ; Wu, Thomas Meng-Hsiu ; Yeh, Shang-Fu...
Sensors.  23 (2023)  18 - p. 7959 , 2023
Link: https://doi.org/10.3390/..
 
?
2

Statistical Analysis of Random Telegraph Noises of MOSFET S..:

Chao, Calvin Yi-Ping ; Wu, Meng-Hsu ; Yeh, Shang-Fu...
IEEE Journal of the Electron Devices Society.  9 (2021)  - p. 972-984 , 2021
Link: https://doi.org/10.1109/..
 
?
3

Session 7 Overview: Imagers and Range Sensors:

, In: 2021 IEEE International Solid-State Circuits Conference (ISSCC),
Suntharalingam, Vyshnavi ; Chao, Calvin Yi-Ping ; Rae, Bruce - p. 104-105 , 2021
Link: https://doi.org/10.1109/..
 
?
4

Random Telegraph Noises from the Source Follower, the Photo..:

Chao, Calvin Yi-Ping ; Yeh, Shang-Fu ; Wu, Meng-Hsu...
Sensors.  19 (2019)  24 - p. 5447 , 2019
Link: https://doi.org/10.3390/..
 
?
5

Hydrogenation of boron acceptor in silicon during electron ..:

Chao, Calvin Yi-Ping ; Luo, Marie Shiang-Chyong ; Pan, Samuel Cheng-Sheng.
Applied Physics Letters.  50 (1987)  4 - p. 180-181 , 1987
Link: https://doi.org/10.1063/..
 
?
6

Random Telegraph Noise Degradation Caused by Hot Carrier In..:

Chao, Calvin Yi-Ping ; Wu, Thomas Meng-Hsiu ; Yeh, Shang-Fu...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10535337/.  , 2023
Link: http://www.ncbi.nlm.nih...
 
?
7

Statistical Analysis of the Random Telegraph Noise in a 1.1..:

Chao, Calvin Yi-Ping ; Tu, Honyih ; Wu, Thomas Meng-Hsiu...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5751670/.  , 2017
Link: http://www.ncbi.nlm.nih...
 
?
8

Random Telegraph Noise Degradation Caused by Hot Carrier In..:

Calvin Yi-Ping Chao ; Thomas Meng-Hsiu Wu ; Shang-Fu Yeh...
https://www.mdpi.com/1424-8220/23/18/7959.  , 2023
Link: https://doi.org/10.3390/..
 
?
9

Statistical Analysis of Random Telegraph Noises of MOSFET S..:

Calvin Yi-Ping Chao ; Meng-Hsu Wu ; Shang-Fu Yeh...
https://ieeexplore.ieee.org/document/9577145/.  , 2021
Link: https://doi.org/10.1109/..
 
?
10

Random Telegraph Noises in CMOS Image Sensors Caused by Var..:

Calvin Yi-Ping Chao ; Thomas M.-H. Wu ; Shang-Fu Yeh...
https://ieeexplore.ieee.org/document/8612927/.  , 2019
Link: https://doi.org/10.1109/..
 
?
11

Random Telegraph Noises from the Source Follower, the Photo..:

Calvin Yi-Ping Chao ; Shang-Fu Yeh ; Meng-Hsu Wu...
https://dx.doi.org/10.3390/s19245447.  , 2019
Link: https://doi.org/10.3390/..
 
?
12

CMOS Image Sensor Random Telegraph Noise Time Constant Extr..:

Calvin Yi-Ping Chao ; Honyih Tu ; Thomas Wu...
https://ieeexplore.ieee.org/document/7731134/.  , 2017
Link: https://doi.org/10.1109/..
 
?
13

Statistical Analysis of the Random Telegraph Noise in a 1.1..:

Calvin Yi-Ping Chao ; Honyih Tu ; Thomas Meng-Hsiu Wu...
https://www.mdpi.com/1424-8220/17/12/2704.  , 2017
Link: https://doi.org/10.3390/..
 
?
14

Extraction and Estimation of Pinned Photodiode Capacitance ..:

Calvin Yi-Ping Chao ; Yi-Che Chen ; Kuo-Yu Chou...
https://ieeexplore.ieee.org/document/6799991/.  , 2014
Link: https://doi.org/10.1109/..
 
?
15

Clinical Features and Long-Term Outcomes of Patients Diagno..:

Zhou, Xiao-Dong ; Lonardo, Amedeo ; Pan, Calvin Q....
Journal of Hepatology.  , 2024
Link: https://doi.org/10.1016/..
 
1-15