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Chao, Shuanshe
6  Ergebnisse:
Personensuche X
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1

Investigation on the Root Cause of ESD Failure of Large Siz..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),
Zhang, Yunhe ; Lin, Shaobing ; Chao, Shuanshe... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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2

Research on the Functional Failure of Large Scale Chips Cau..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Chao, Shuanshe ; Lin, Xinyi ; Wei, Xixiong... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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3

Failure Analysis for IIH leakage on 7nm FinFFT Technology C..:

, In: 2023 24th International Conference on Electronic Packaging Technology (ICEPT),
Chao, Shuanshe ; Lin, Xinyi ; Dong, Chen... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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4

Study on Stress Migration of FCQFN Package with Unbalanced ..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
Chao, Shuanshe ; Lin, Xinyi ; Yang, Dan... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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5

Investigation on Yield Improvement of Fan-Out Wafer-Level P..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
Zhu, Kai ; Chao, Shuanshe ; Chen, Yang... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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6

Measurement Process Optimization in Using Lock-in Thermogra..:

, In: 2021 22nd International Conference on Electronic Packaging Technology (ICEPT),
Chao, Shuanshe ; Mei, Na ; Lin, Xinyi... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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