Chaplygin, Yury A.
8  Ergebnisse:
Personensuche X
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2

Analysis of the Endurance of CMOS IC Elements to Failures a..:

, In: 2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus),
 
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3

Design Procedure of RF Quadrature Modulators and Demodulato..:

, In: 2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus),
 
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4

Field Transistor Research for X-band Low Noise Amplifier De..:

, In: 2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus),
 
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5

External Bit Interleaving for Commercial SRAM:

, In: 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus),
Fateev, Ivan ; Chaplygin, Yury A. - p. 1795-1798 , 2020
 
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6

Development of a Technological Route for the Silicon Micron..:

, In: 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus),
 
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7

The Radiation Hardening Methods for Blocks of Memory Integr..:

, In: 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus),
 
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