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Chasin, Adrian
51  Ergebnisse:
Personensuche X
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1

Light-Assisted Investigation of the Role of Oxygen Flow dur..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Rinaudo, Pietro ; Chasin, Adrian ; Zhao, Ying... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Fundamental understanding of NBTI degradation mechanism in ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Zhao, Ying ; Rinaudo, Pietro ; Chasin, Adrian... - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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3

Characterization of trap density in Indium-Gallium-Zinc-Oxi..:

Tang, Hongwei ; Belmonte, Attilio ; Lin, Dennis...
Solid-State Electronics.  214 (2024)  - p. 108866 , 2024
Link: https://doi.org/10.1016/..
 
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4

Charge Trapping and Emission during Bias Temperature Stress..:

O'Sullivan, Barry ; Rathi, Aarti ; Alian, Alireza...
Micromachines.  15 (2024)  8 - p. 951 , 2024
Link: https://doi.org/10.3390/..
 
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5

A Physical TCAD Mobility Model of Amorphous In-Ga-Zn-O (a-I..:

Thesberg, Mischa ; Schanovsky, Franz ; Zhao, Ying...
Micromachines.  15 (2024)  7 - p. 829 , 2024
Link: https://doi.org/10.3390/..
 
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6

MTJ degradation in multi-pillar SOT-MRAM with selective wri..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Van Beek, Simon ; Cai, Kaiming ; Fan, Kaiquan... - p. 1-7 , 2023
Link: https://doi.org/10.1109/..
 
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7

Compact Physics Hot-Carrier Degradation Model Valid over a ..:

Tyaginov, Stanislav ; Bury, Erik ; Grill, Alexander...
Micromachines.  14 (2023)  11 - p. 2018 , 2023
Link: https://doi.org/10.3390/..
 
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8

Investigating Nanowire, Nanosheet and Forksheet FET Hot-Car..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Vandemaele, Michiel ; Kaczer, Ben ; Bury, Erik... - p. 1-10 , 2023
Link: https://doi.org/10.1109/..
 
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9

Impact of Nitridation on Bias Temperature Instability and H..:

Tyaginov, Stanislav ; O'Sullivan, Barry ; Chasin, Adrian...
Micromachines.  14 (2023)  8 - p. 1514 , 2023
Link: https://doi.org/10.3390/..
 
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10

MTJ degradation in SOT-MRAM by self-heating-induced diffusi..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Van Beek, Simon ; Cai, Kaiming ; Rao, Siddharth... - p. 4A.2-1-4A.2-4 , 2022
Link: https://doi.org/10.1109/..
 
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11

Deep Understanding of Electron Beam Effects on 2D Layered S..:

Lee, Kookjin ; Ji, Hyunjin ; Kim, Yanghee...
Advanced Materials Interfaces.  9 (2022)  9 - p. , 2022
Link: https://doi.org/10.1002/..
 
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12

Complex amorphous oxides: property prediction from high thr..:

van Setten, Michiel J. ; Dekkers, Hendrik F. W. ; Pashartis, Christopher...
Materials Advances.  3 (2022)  23 - p. 8413-8427 , 2022
Link: https://doi.org/10.1039/..
 
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13

Cyclic Thermal Effects on Devices of Two‐Dimensional Layere..:

Kim, Yeonsu ; Kaczer, Ben ; Verreck, Devin...
Advanced Electronic Materials.  7 (2021)  9 - p. 2100348 , 2021
Link: https://doi.org/10.1002/..
 
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14

The properties, effect and extraction of localized defect p..:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Vandemaele, Michiel ; Kaczer, Ben ; Tyaginov, Stanislav... - p. 1-7 , 2021
Link: https://doi.org/10.1109/..
 
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15

Modeling and Understanding the Compact Performance of h‐BN ..:

Lee, Kookjin ; Choi, Junhee ; Kaczer, Ben...
Advanced Functional Materials.  31 (2021)  23 - p. , 2021
Link: https://doi.org/10.1002/..
 
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