Chen, Q.Y.
~ 73000  Ergebnisse:
Personensuche X
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1

Quench Analysis and Experiment of CiADS Linac Superconducti..:

Zheng, S. J. ; Yuan, P. ; Wu, W....
IEEE Transactions on Applied Superconductivity.  34 (2024)  5 - p. 1-5 , 2024
 
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2

FFAR4 activation inhibits lung adenocarcinoma via blocking ..:

Wang, Zhe ; Li, Jinyou ; Wang, LongFei...
Cellular & Molecular Biology Letters.  29 (2024)  1 - p. , 2024
 
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5

The technology of shielding design for nuclear reactor: A r..:

Chen, Y.Q. ; Yan, B.H.
Progress in Nuclear Energy.  161 (2023)  - p. 104741 , 2023
 
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6

Beam dynamic design and study of a linac with variable outp..:

Li, H.P. ; Su, H.Q. ; Chen, Y.Q....
Journal of Instrumentation.  18 (2023)  7 - p. P07032 , 2023
 
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7

Fuzzy Adaptive Tuning PI Control Based MPPT Method for Vari..:

, In: Lecture Notes in Electrical Engineering; Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit,
Li, S. S. ; Li, Y. G. ; He, J.. - p. 31-38 , 2023
 
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8

Effect of Initial Orientation on Microstructural Evolution ..:

, In: Lecture Notes in Mechanical Engineering; Proceedings of the 14th International Conference on the Technology of Plasticity - Current Trends in the Technology of Plasticity,
Chen, Y. Q. ; Xu, J. B. ; He, Z. M.... - p. 623-629 , 2023
 
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9

Effects of initial orientation on microstructure evolution ..:

Chen, Y.Q. ; Xu, J.B. ; Pan, S.P....
Materials Science and Engineering: A.  883 (2023)  - p. 145502 , 2023
 
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11

Effect of substrate thinning on heavy ion induced single ev..:

Zhao, S.W. ; Yan, X.Y. ; Liu, Y.Z....
Microelectronics Reliability.  150 (2023)  - p. 115197 , 2023
 
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12

Influence of annealing on recrystallization and mechanical ..:

Feng, Z.H. ; Wang, J.Q. ; Dong, H.C....
Journal of Materials Research and Technology.  24 (2023)  - p. 4980-4985 , 2023
 
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13

Total-ionizing dose irradiation induced degradation behavio..:

Cai, X Z ; Chen, Y Q ; Zhou, C J
Semiconductor Science and Technology.  38 (2023)  5 - p. 055006 , 2023
 
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15

Modelling and analysis of contactless sensor for TSV fault ..:

Liu, X.Y. ; Chen, Y.Q. ; Fu, Z.W...
Microelectronics Reliability.  145 (2023)  - p. 115005 , 2023
 
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