Chen, Wenxiang
1857  Ergebnisse:
Personensuche X
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2

Mechanism of electrical performance deterioration in a-Si:H..:

Chen, Wenxiang ; Luo, Xu ; Liu, Dan...
Microelectronics Reliability.  156 (2024)  - p. 115379 , 2024
 
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8

Carbon emission measurement of the envelope of a university..:

Gan, Shenqi ; Feng, Jiawang ; Fang, Bigen.
International Journal of Low-Carbon Technologies.  19 (2024)  - p. 1026-1040 , 2024
 
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9

P‐7.1: Effect of S/D Decap Times on Ion attenuation in ADS ..:

Chen, Wenxiang ; Luo, Xu ; Liu, Dan...
SID Symposium Digest of Technical Papers.  54 (2023)  S1 - p. 696-699 , 2023
 
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10

P‐7.2: Suppression of Ion Drop of ITO‐Decapped a:Si‐H TFT f..:

Liu, Dan ; Huang, Zhonghao ; Wu, Xu...
SID Symposium Digest of Technical Papers.  54 (2023)  S1 - p. 700-703 , 2023
 
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12

Robust exponential stabilization and L2‐gain analysis for s..:

Chen, Wenxiang ; Zhang, Xinquan
Optimal Control Applications and Methods.  45 (2023)  2 - p. 674-699 , 2023
 
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13

Correlative Mapping of Electrolyte-Dependent Microstructura..:

Chen, Wenxiang ; Pidaparthy, Saran ; Zhan, Xun...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1277-1278 , 2023
 
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14

LDSSNV: A Linkage Disequilibrium-Based Method for the Detec..:

Lan, Jingfen ; Chen, Wenxiang ; Yin, Ganggang...
IEEE/ACM Transactions on Computational Biology and Bioinformatics.  , 2023
 
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15

Calculating the Hawking Temperatures of Conventional Black ..:

Chen, Wen-Xiang ; Li, Jun-Xian ; Zhang, Jing-Yi
International Journal of Theoretical Physics.  62 (2023)  5 - p. , 2023
 
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