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1

A Survey on Hardware-Based Malware Detection Approaches:

Chenet, Cristiano Pegoraro ; Savino, Alessandro ; Di Carlo, Stefano
IEEE Access. 12 (2024) - p. 54115-54128 , 2024

Link: https://doi.org/10.1109/..

2

Using Analog Scrambling Circuits for Automotive Sensor Inte..:

, In: 2022 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR),

Chenet, Cristiano Pegoraro ; Savino, Alessandro ; Di Carlo, Stefano - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

3

A survey of hardware-based malware detection approach:

Chenet, Cristiano Pegoraro ; Savino, Alessandro ; Di Carlo, Stefano
http://arxiv.org/abs/2303.12525. , 2023

Link: http://arxiv.org/abs/230..

4

Using analog scrambling circuits for automotive sensor inte..:

Chenet, Cristiano Pegoraro ; Savino, Alessandro ; di Carlo, Stefano
http://arxiv.org/abs/2202.10168. , 2022

Link: http://arxiv.org/abs/220..

5

Using Analog Scrambling Circuits for Automotive Sensor Inte..:

Chenet, Cristiano Pegoraro ; Savino, Alessandro ; Di Carlo, Stefano
info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-7933-2. , 2022

Link: http://hdl.handle.net/11..

6

Fault injection on a mixed-signal programmable SoC with des..:

González Aguilera, Carlos Julio ; Chenet, Cristiano Pegoraro ; Balen, Tiago Roberto
Journal of integrated circuits and systems. Porto Alegre, RS. Vol. 11, no. 3 (Dec. 2016), p. 185-191. , 2016

Link: http://hdl.handle.net/10..

7

Análise de soft errors em conversores analógico-digitais e ..:

Chenet, Cristiano Pegoraro , 2015

Link: http://hdl.handle.net/10..

8

Fault Injection on a Mixed-Signal Programmable SoC with Des..:

Aguilera, Carlos J. G. ; Chenet, Cristiano P. ; Balen, Tiago R.
Journal of Integrated Circuits and Systems. 11 (2020) 3 - p. 185-191 , 2020

Link: https://doi.org/10.29292..

9

Exploring design diversity redundancy to improve resilience..:

Chenet, Cristiano P. ; Tambara, Lucas A. ; de Borges, Gabriel M....
Microelectronics Reliability. 55 (2015) 12 - p. 2833-2844 , 2015

Link: https://doi.org/10.1016/..

10

Validation, Verification, and Testing (VVT) of future RISC-..:

, In: 2023 IEEE European Test Symposium (ETS),

Alonso, Marti ; Andreu, David ; Canal, Ramon... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

11

VITAMIN-V: Virtual Environment and Tool-Boxing for Trustwor..:

, In: 2023 26th Euromicro Conference on Digital System Design (DSD),

Canal, Ramon ; Chenet, Cristiano ; Arelakis, Angelos... - p. 302-308 , 2023

Link: https://doi.org/10.1109/..

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