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Chery, Emmanuel
92  Ergebnisse:
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1

Characterization and Reliability Study of an Al-Doped HfO₂-..:

Chery, Emmanuel ; Croes, Kristof ; Nolmans, Philip.
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3845-3851 , 2024
Link: https://doi.org/10.1109/..
 
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2

Voltage ramp stress based lifetime-prediction model of adva..:

Fohn, Corinna ; Chery, Emmanuel ; Croes, Kristof..
Solid-State Electronics.  213 (2024)  - p. 108864 , 2024
Link: https://doi.org/10.1016/..
 
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3

Reliability Investigations of Advanced Photosensitive Polym..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Chery, Emmanuel ; Bhatia, Ritwik ; Sundaram, Ganesh.. - p. 647-653 , 2024
Link: https://doi.org/10.1109/..
 
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4

Inorganic capping layers in advanced photosensitive polymer..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Pinho, Nelson ; Chery, Emmanuel ; Bhatia, Ritwik... - p. 2040-2045 , 2023
Link: https://doi.org/10.1109/..
 
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5

Reliability Investigations of Polymer Based Redistribution ..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Kwak, Ji-Youn ; Chery, Emmanuel ; Bertheau, Julien... - p. 1080-1084 , 2023
Link: https://doi.org/10.1109/..
 
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6

Ultra-Fine Pitch RDL (UFPRDL) using Polymer Dual Damascene ..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Pinho, Nelson ; Chery, Emmanuel ; Pantano, Nicolas... - p. 1364-1368 , 2023
Link: https://doi.org/10.1109/..
 
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7

Reliability Challenges in Advanced 3D Technologies: The Cas..:

Chery, Emmanuel ; Fohn, Corinna ; Messemaeker, Joke De.
IEEE Transactions on Device and Materials Reliability.  23 (2023)  4 - p. 615-622 , 2023
Link: https://doi.org/10.1109/..
 
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8

Low-Temperature Oxidation Kinetics of Polymer-Embedded ECD ..:

Chery, Emmanuel ; Croes, Kristof
JOM.  75 (2023)  6 - p. 1874-1879 , 2023
Link: https://doi.org/10.1007/..
 
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9

The Challenges and Solutions of Cu/SiCN Wafer-to-Wafer Hybr..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chew, Soon-Aik ; Zhang, Boyao ; Vanstreels, Kris... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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10

Investigating the Efficacy of Hafnium Dioxide Barrier Layer..:

Brady-Boyd, Anita ; Chery, Emmanuel ; Armini, Silvia
The Journal of Physical Chemistry Letters.  13 (2022)  34 - p. 8130-8133 , 2022
Link: https://doi.org/10.1021/..
 
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11

Broadband Characterization of Polymers under Reliability St..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Pantano, Nicolas ; Chery, Emmanuel ; De Beeck, Maaike Op.. - p. 1218-1223 , 2022
Link: https://doi.org/10.1109/..
 
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12

Vapor deposited thin organic–inorganic capping layers preve..:

Chery, Emmanuel ; Brady-Boyd, Anita ; Lin, Yuyuan...
Microelectronic Engineering.  266 (2022)  - p. 111896 , 2022
Link: https://doi.org/10.1016/..
 
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13

Photosensitive polymer reliability for fine pitch RDL appli..:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
Chery, Emmanuel ; Duval, Fabrice F. C. ; Stucchi, Michele... - p. 1234-1240 , 2020
Link: https://doi.org/10.1109/..
 
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14

Extreme Wafer Thinning and nano-TSV processing for 3D Heter..:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
Jourdain, Anne ; Schleicher, Filip ; De Vos, Joeri... - p. 42-48 , 2020
Link: https://doi.org/10.1109/..
 
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15

Investigating the Efficacy of Hafnium Dioxide Barrier Layer..:

Brady-Boyd, Anita ; Chery, Emmanuel ; Armini, Silvia
info:eu-repo/grantAgreement/EC/H2020/888163/.  , 2022
Link: https://zenodo.org/recor..
 
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