E-LIB Suche - Ergebnisse für: Chien, Kary

1

Optimization of TEM sample preparation methods by FIB for t..:

, In: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),

Shuqing Duan ; Chien, Kary ; Ruijuan Qi... - p. 99-102 , 2013

Link: https://doi.org/10.1109/..

2

Quantitative Index for Prediction of Properties of Process ..:

Ma, Jinyi Jenny ; Kang, Sheng Randy ; Chen, Zhenxiang JS...
ECS Transactions. 52 (2013) 1 - p. 813-817 , 2013

Link: https://doi.org/10.1149/..

3

Apply DFT Integrated Enhanced EBAC Methodology on Defect Is..:

Kary Chien, Wei-Ting ; Lester Yin, Yuanzi
Journal of Failure Analysis and Prevention. 18 (2018) 6 - p. 1490-1502 , 2018

Link: https://doi.org/10.1007/..

4

Extensions of the kaplan-meier estimator:

Kary Chien, Wei-Ting ; Kuo, Way
Communications in Statistics - Simulation and Computation. 24 (1995) 4 - p. 953-964 , 1995

Link: https://doi.org/10.1080/..

5

Use of the dirichlet process for reliability analysis:

Kary Chien, Wei-Ting ; Kuo, Way
Computers & Industrial Engineering. 27 (1994) 1-4 - p. 339-343 , 1994

Link: https://doi.org/10.1016/..

6

Investigations and detections on a new BEOL dielectric fail..:

Chien, Wei-Ting Kary ; Zhao, Yong Atman ; Zhang, Liwen.
Microelectronics Reliability. 81 (2018) - p. 368-372 , 2018

Link: https://doi.org/10.1016/..

7

Early detection and prediction of HKMG SRAM HTOL performanc..:

Chien, Wei-Ting Kary ; Zhao, Yong Atman ; Zhu, Yueqin.
Microelectronics Reliability. 64 (2016) - p. 185-188 , 2016

Link: https://doi.org/10.1016/..

8

Influence of I/O oxide process on the NBTI performance of 2..:

Chien, Wei-Ting Kary ; Zhu, Yueqin ; Song, Yongliang.
Microelectronics Reliability. 64 (2016) - p. 220-224 , 2016

Link: https://doi.org/10.1016/..

9

Ultra low-K CPI evaluations for foundry backend and assembl..:

, In: 2015 Annual Reliability and Maintainability Symposium (RAMS),

Jin, Morn ; He, Wenwen ; Yang, Kelly. - p. 1-6 , 2015

Link: https://doi.org/10.1109/..

10

A study on the statistical comparison methods for engineeri..:

, In: 2013 IEEE International Conference on Industrial Engineering and Engineering Management,

Ji, Xin-Yuan Serena ; Kang, Shen Randy ; Yu, Yan-Ju Lisa. - p. 576-580 , 2013

Link: https://doi.org/10.1109/..

11

An enhancement for single sampling plan method:

, In: 2013 IEEE International Conference on Industrial Engineering and Engineering Management,

Kang, Sheng Randy ; Lisa-Yu, Yan-Ju ; Chien, Wei-Ting Kary - p. 1174-1178 , 2013

Link: https://doi.org/10.1109/..

12

A Study On The Dielectric Intrinsic Breakdown Specification:

Han, Kun ; Zhao, Yong A. ; Guo, Qiang.
ECS Transactions. 44 (2012) 1 - p. 1137-1144 , 2012

Link: https://doi.org/10.1149/..

13

Some practical considerations for effective and efficient w..:

Tseng, Summer F.C. ; Chien, Wei-Ting Kary ; Gong, Excimer..
Microelectronics Reliability. 44 (2004) 8 - p. 1233-1243 , 2004

Link: https://doi.org/10.1016/..

14

Improvement of poly-silicon hole induced gate oxide failure..:

Tseng, Summer F.C. ; Chien, Wei-Ting Kary ; Cai, Bing-Chu
Microelectronics Reliability. 43 (2003) 5 - p. 713-724 , 2003

Link: https://doi.org/10.1016/..

15

A nonparametric Bayes approach to decide system burn-in tim:

Chien, Wei-Ting Kary ; Kuo, Way
Naval Research Logistics. 44 (1997) 7 - p. 655-671 , 1997

Link: https://doi.org/10.1002/..