Chien, Ya-Ting
7283  Ergebnisse:
Personensuche X
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3

Investigation of Hydrogen Diffusion in Top Gate IGZO TFTs b..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
 
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4

Stably Saturated Output Current Characteristics and Hot-Car..:

Tu, Yu-Fa ; Huang, Jen-Wei ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  70 (2023)  9 - p. 4669-4673 , 2023
 
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5

Performance improvement of Zn0.5Mg0.5O UV sensor by supercr..:

Chien, Ya-Ting ; Tu, Hong-Yi ; Chen, Wen-Chung...
Materials Science in Semiconductor Processing.  158 (2023)  - p. 107343 , 2023
 
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6

Impact of Variant Gate Insulator Fabrication Process on Rel..:

Chien, Ya-Ting ; Zhou, Kuan-Ju ; Tai, Mao-Chou...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1089-1094 , 2023
 
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7

Abnormal Threshold Voltage Shift and Sub-channel Generation..:

Zhou, Kuan-Ju ; Chang, Ting-Chang ; Tai, Mao-Chou...
ACS Applied Electronic Materials.  5 (2023)  2 - p. 1183-1188 , 2023
 
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8

Abnormal Degradation Behaviors Under Negative Bias Stress i..:

Wu, Chia-Chuan ; Ma, William Cheng-Yu ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1079-1084 , 2023
 
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9

Heterogeneous metal oxide channel structure for ultra-high ..:

Zhou, Kuan-Ju ; Chen, Po-Hsun ; Zheng, Yu-Zhe...
Journal of Materials Chemistry C.  10 (2022)  24 - p. 9192-9197 , 2022
 
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10

Investigation of Electrical Characteristics in Low-Temperat..:

, In: 2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA),
 
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11

Suppressing Drain-Induced Barrier Lowering and Kink Effect ..:

Zhou, Kuan-Ju ; Zheng, Yu-Zhe ; Tai, Mao-Chou...
IEEE Electron Device Letters.  43 (2022)  4 - p. 576-579 , 2022
 
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13

Performance Enhancement of InGaZnO Top-Gate Thin Film Trans..:

Chien, Ya-Ting ; Tsai, Yu-Lin ; Zhou, Kuan-Ju...
IEEE Electron Device Letters.  42 (2021)  11 - p. 1611-1614 , 2021
 
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14

Abnormal hysteresis formation in hump region after positive..:

Tu, Hong-Yi ; Chang, Ting-Chang ; Tsao, Yu-Ching...
Journal of Physics D: Applied Physics.  53 (2020)  40 - p. 405104 , 2020
 
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