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Chillarige, Sameer
11  Ergebnisse:
Personensuche X
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1

Addressing Physically Aware Diagnosis Challenges in Hierarc..:

, In: 2023 IEEE International Test Conference India (ITC India),
Nandakumar, Bharath ; Chillarige, Sameer ; L'Esperance, Nicholai.. - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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2

Low cost production scan chain test for compression based d..:

, In: 2023 IEEE International Test Conference (ITC),
Nandakumar, Bharath ; Chillarige, Sameer - p. 350-356 , 2023
Link: https://doi.org/10.1109/..
 
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3

Accurate Diagnosis of Cell Internal Defects with Multiple E..:

, In: 2022 IEEE International Test Conference India (ITC India),
Kathpalia, Sonam ; Chillarige, Sameer ; Nandakumar, Bharath.. - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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4

Scaling physically aware logic diagnosis to complex high vo..:

, In: 2022 IEEE International Test Conference (ITC),
Nandakumar, Bharath ; Maheshwari, Madhur ; Chillarige, Sameer... - p. 340-347 , 2022
Link: https://doi.org/10.1109/..
 
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5

PPA Optimization of Test Points in Automotive Designs:

, In: 2022 IEEE International Test Conference (ITC),
Foutz, Brian ; Singhal, Sarthak ; Rai, Prateek Kumar... - p. 204-212 , 2022
Link: https://doi.org/10.1109/..
 
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6

Diagnosis and Yield Learning:

, In: 2021 IEEE International Test Conference in Asia (ITC-Asia),
Huang, Yu ; Cheng, Wu-Tung ; Guo, Ruifeng. - p. 1-1 , 2021
Link: https://doi.org/10.1109/..
 
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7

Machine Learning Driven Throughput Optimization of Volume D..:

, In: 2020 IEEE International Test Conference India,
Chillarige, Sameer ; Malik, Anil ; Amodeo, Martin... - p. 1-8 , 2020
Link: https://doi.org/10.1109/..
 
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8

Improved Chain Diagnosis Methodology for Clock and Control ..:

, In: 2020 IEEE International Test Conference (ITC),
Nandakumar, Bharath ; Chillarige, Sameer ; Malik, Anil... - p. 1-9 , 2020
Link: https://doi.org/10.1109/..
 
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9

Improved Diagnosis Methodology for Multi-Defect Scenarios i..:

, In: 2019 IEEE International Test Conference India (ITC India),
Nandakumar, Bharath ; Malik, Anil ; Chhabra, Atul... - p. 1-10 , 2019
Link: https://doi.org/10.1109/..
 
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10

High Throughput Chain Diagnosis Methodology with Minimal Fa..:

, In: 2019 IEEE International Test Conference India (ITC India),
Chillarige, Sameer ; Malik, Anil ; Chhabra, Atul.. - p. 1-9 , 2019
Link: https://doi.org/10.1109/..
 
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11

ETS 2022 ORGANIZING COMMITTEE:

Manich Bou, Salvador ; Rodríguez Montañés, Rosa ; Bernardi, Paolo...
Manich Bou, S. [et al.]. ETS 2022 ORGANIZING COMMITTEE. A: 27th IEEE European Test Symposium (ETS). 2022,.  , 2022
Link: http://hdl.handle.net/21..
 
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