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Chimenton, Andrea
6  Ergebnisse:
Personensuche X
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1

New Statistical Data and Modeling of Stress-Induced Leakage..:

Chimenton, Andrea ; Mielke, Neal R. ; Cho, Eunhwan.
IEEE Electron Device Letters.  43 (2022)  1 - p. 29-31 , 2022
Link: https://doi.org/10.1109/..
 
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2

Dielectric Reliability for Future Logic and Non-Volatile Me..:

Padovani, Andrea ; Larcher, Luca ; Chimenton, Andrea..
ECS Transactions.  8 (2007)  1 - p. 237-242 , 2007
Link: https://doi.org/10.1149/..
 
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3

Reliability of erasing operation in NOR-Flash memories:

Chimenton, Andrea ; Olivo, Piero
Microelectronics Reliability.  45 (2005)  7-8 - p. 1094-1108 , 2005
Link: https://doi.org/10.1016/..
 
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4

Erratic Bits in Flash Memories under Fowler-Nordheim Progra..:

Chimenton, Andrea ; Pellati, Paolo ; Olivo, Piero
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 4B - p. 2041-2043 , 2003
Link: https://doi.org/10.1143/..
 
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5

Flash Memory Reliability: an Improvement Against Erratic Er..:

Chimenton, Andrea ; Olivo, Piero
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 4B - p. 2025-2027 , 2003
Link: https://doi.org/10.1143/..
 
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6

Threshold voltage spread in flash memories under a constant..:

Chimenton, Andrea ; Pellati, Paolo ; Olivo, Piero
Microelectronic Engineering.  59 (2001)  1-4 - p. 197-201 , 2001
Link: https://doi.org/10.1016/..
 
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