Chimitova, Ekaterina V.
26  Ergebnisse:
Personensuche X
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1

Comparative Analysis of Visualizing Methods for Multidimens..:

, In: 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON),
 
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2

Chi-squared goodness-of-fit tests for censored data 

Stochastic models in survival analysis and reliability set, volume 3
 
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3

The optimization of drilling conditions by using accelerate..:

, In: 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE),
 
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4

An investigation of statistical properties of parameter est..:

, In: 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE),
 
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5

An investigation of statistical properties of parameter est..:

, In: 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE),
 
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6

The construction of degradation trend using the "random-eff..:

, In: 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE),
 
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8

Statistical Degradation Models for Reliability Analysis in ..:

Chetvertakova, E S ; Chimitova, E V
IOP Conference Series: Materials Science and Engineering.  189 (2017)  - p. 012017 , 2017
 
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9

The construction of degradation trend using the "random-eff..:

, In: 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE),
 
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10

The construction of probabilistic reliability model with on..:

, In: 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE),
Chimitova, E. V. - p. 1-1 , 2014
 
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11

Using nonparametric goodness-of-fit tests to validate accel..:

Galanova, N. S. ; Lemeshko, B. Yu. ; Chimitova, E. V.
Optoelectronics, Instrumentation and Data Processing.  48 (2012)  6 - p. 580-592 , 2012
 
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