Cho, Chen-Yi
7737  Ergebnisse:
Personensuche X
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1

Unraveling the Wake-Up Mechanism in Ultrathin Ferroelectric..:

Cho, Chen-Yi ; Chao, Tzu-Yi ; Lin, Tzu-Yao...
IEEE Transactions on Electron Devices.  71 (2024)  5 - p. 3365-3370 , 2024
 
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2

Perspective Roadmap of Advanced HfO2-based Ferroelectric Fi..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
De, Sourav ; Cho, Chen-Yi ; Ali, Tarek... - p. 1-3 , 2024
 
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3

Trade-off Between Thermal Budget and Thickness Scaling: A B..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chiu, Chui-Yi ; De, Sourav ; Cho, Chen-Yi. - p. 1-3 , 2024
 
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4

Two-Transistor Metal–Ferroelectric–Metal Field-Effect Trans..:

Wu, Ming-Hung ; Cho, Chen-Yi ; Huang, Hsin-Hui...
IEEE Transactions on Electron Devices.  70 (2023)  12 - p. 6268-6272 , 2023
 
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5

Wake-Up of Ultrathin Ferroelectric Hf0.5Zr0.5O2: The Origin..:

, In: 2023 International Electron Devices Meeting (IEDM),
Cho, Chen-Yi ; Chao, Tzu-Yi ; Lin, Tzu-Yao... - p. 1-4 , 2023
 
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6

Two-Transistor Metal-Ferroelectric-Metal Field- Effect Tran..:

Wu, Ming-Hung ; Cho, Chen-Yi ; Huang, Hsin-Hui...
IEEE Transactions on Electron Devices.  70 (2023)  12 - p. 6262-6267 , 2023
 
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7

Modeling Fatigue-Breakdown Dilemma in Ferroelectric Hf0.5 Z..:

, In: 2022 International Electron Devices Meeting (IEDM),
Huang, Hsin-Hui ; Cho, Chen-Yi ; Lin, Tzu-Yao... - p. 13.5.1-13.5.4 , 2022
 
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8

Highly Reliable, Scalable, and High-Yield HfZrOx FRAM by Ba..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lin, Yu-De ; Yeh, Po-Chun ; Dai, Jheng-Yang... - p. 32.1.1-32.1.4 , 2022
 
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15

Adaptation to Endoplasmic Reticulum Stress Enhances Resista..:

Chen, Cho-Yi ; Kawasumi, Masaoki ; Lan, Tien-Yun...
International Journal of Molecular Sciences.  22 (2020)  1 - p. 355 , 2020
 
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