E-LIB Suche - Ergebnisse für: Cho, Hag-Ju

1

Investigation on Molybdenum and Its Conductive Oxides as p-..:

Li, Zilan ; Schram, Tom ; Witters, Thomas...
ECS Transactions. 11 (2007) 4 - p. 575-583 , 2007

Link: https://doi.org/10.1149/..

2

DyScHfOx as High-κ Gate Dielectrics: Structural and Electri..:

Adelmann, Christoph ; Van Elshocht, Sven ; Lehnen, Peer...
ECS Transactions. 6 (2007) 1 - p. 113-120 , 2007

Link: https://doi.org/10.1149/..

3

Achieving Conduction Band-Edge Effective Work Functions by ..:

Ragnarsson, Lars-Ake ; Chang, Vincent S. ; Yu, Hong Yu...
IEEE Electron Device Letters. 28 (2007) 6 - p. 486-488 , 2007

Link: https://doi.org/10.1109/..

4

Effects of Post-Deposition Annealing on the Electrical Prop..:

Cho, Hag-Ju ; Lee, Hye Lan ; Park, Hong Bae...
Japanese Journal of Applied Physics. 44 (2005) 4S - p. 2230 , 2005

Link: https://doi.org/10.1143/..

5

Effects of dielectric structure of HfO2 on carrier generati..:

Kang, Chang Yong ; Cho, Hag-Ju ; Choi, Rino...
Applied Physics Letters. 84 (2004) 12 - p. 2148-2150 , 2004

Link: https://doi.org/10.1063/..

6

Effects of high temperature forming gas anneal on the chara..:

Choi, Rino ; Kang, Chang Seok ; Cho, Hag-Ju...
Applied Physics Letters. 84 (2004) 24 - p. 4839-4841 , 2004

Link: https://doi.org/10.1063/..

7

Bonding states and electrical properties of ultrathin HfOxN..:

Kang, Chang Seok ; Cho, Hag-Ju ; Onishi, Katsunori...
Applied Physics Letters. 81 (2002) 14 - p. 2593-2595 , 2002

Link: https://doi.org/10.1063/..

8

Evaluation of silicon surface nitridation effects on ultra-..:

Nieh, Renee ; Choi, Rino ; Gopalan, Sundar...
Applied Physics Letters. 81 (2002) 9 - p. 1663-1665 , 2002

Link: https://doi.org/10.1063/..

9

Depletion layer thickness and Schottky type carrier injecti..:

Hwang, Cheol Seong ; Lee, Byoung Taek ; Kang, Chang Seok...
Journal of Applied Physics. 85 (1999) 1 - p. 287-295 , 1999

Link: https://doi.org/10.1063/..

10

Variations of interface potential barrier height and leakag..:

Hwang, Cheol Seong ; Lee, Byoung Taek ; Kim, Jin Won...
Integrated Ferroelectrics. 20 (1998) 1-4 - p. 255-255 , 1998

Link: https://doi.org/10.1080/..

11

A comparative study on the electrical conduction mechanisms..:

Hwang, Cheol Seong ; Lee, Byoung Taek ; Kang, Chang Seok...
Journal of Applied Physics. 83 (1998) 7 - p. 3703-3713 , 1998

Link: https://doi.org/10.1063/..

12

Improvement of leakage current characteristics of Ba0.5Sr0...:

Cho, Hag-Ju ; Oh, Sejun ; Kang, Chang Seok...
Applied Physics Letters. 71 (1997) 22 - p. 3221-3223 , 1997

Link: https://doi.org/10.1063/..

13

Structural and Electrical Properties of Ba0.5Sr0.5TiO3 Film..:

Cho, Hag-Ju ; Kang, Chang Seok ; Hwang, Cheol Seong...
Japanese Journal of Applied Physics. 36 (1997) 7A - p. L874 , 1997

Link: https://doi.org/10.1143/..

14

Preparation and Characterization of Iridium Oxide Thin Film..:

Cho, Hag-Ju ; Horii, Hideki ; Hwang, Cheol Seong...
Japanese Journal of Applied Physics. 36 (1997) 3S - p. 1722 , 1997

Link: https://doi.org/10.1143/..

15

A positive temperature coefficient of resistivity effect fr..:

Hwang, Cheol Seong ; Lee, Byoung Taek ; Cho, Hag-Ju...
Applied Physics Letters. 71 (1997) 3 - p. 371-373 , 1997

Link: https://doi.org/10.1063/..