Choi, Hongjun
147  Ergebnisse:
Personensuche X
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2

Topological persistence guided knowledge distillation for w..:

Jeon, Eun Som ; Choi, Hongjun ; Shukla, Ankita...
Engineering Applications of Artificial Intelligence.  130 (2024)  - p. 107719 , 2024
 
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4

Constrained Adaptive Distillation Based on Topological Pers..:

Jeon, Eun Som ; Choi, Hongjun ; Shukla, Ankita...
IEEE Transactions on Instrumentation and Measurement.  72 (2023)  - p. 1-14 , 2023
 
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5

Understanding the Role of Mixup in Knowledge Distillation: ..:

, In: 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV),
Choi, Hongjun ; Jeon, Eun Som ; Shukla, Ankita. - p. 2318-2327 , 2023
 
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7

Topological Knowledge Distillation for Wearable Sensor Data:

, In: 2022 56th Asilomar Conference on Signals, Systems, and Computers,
Jeon, Eun Som ; Choi, Hongjun ; Shukla, Ankita... - p. 837-842 , 2022
 
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8

Physical Attack on Monocular Depth Estimation with Optimal ..:

, In: Lecture Notes in Computer Science; Computer Vision – ECCV 2022,
Cheng, Zhiyuan ; Liang, James ; Choi, Hongjun... - p. 514-532 , 2022
 
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10

Static Analysis for Software Reliability and Security:

, In: Advances in Security, Networks, and Internet of Things; Transactions on Computational Science and Computational Intelligence,
Choi, Hongjun ; Kang, Dayoung ; Choi, Jin-Young - p. 463-470 , 2021
 
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11

PHYSFRAME: type checking physical frames of reference for r..:

, In: Proceedings of the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering,
Kate, Sayali ; Chinn, Michael ; Choi, Hongjun.. - p. 45-56 , 2021
 
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12

AMC-Loss: Angular Margin Contrastive Loss for Improved Expl..:

, In: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Choi, Hongjun ; Som, Anirudh ; Turaga, Pavan - p. 3659-3666 , 2020
 
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13

Cyber-Physical Inconsistency Vulnerability Identification f..:

, In: Proceedings of the 2020 ACM SIGSAC Conference on Computer and Communications Security,
Choi, Hongjun ; Kate, Sayali ; Aafer, Yousra.. - p. 263-278 , 2020
 
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14

PI-Net: A Deep Learning Approach to Extract Topological Per..:

, In: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
 
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15

Data-driven fault diagnosis based on coal-fired power plant..:

Choi, Hongjun ; Kim, Chang-Wan ; Kwon, Daeil
Journal of Mechanical Science and Technology.  34 (2020)  10 - p. 3931-3936 , 2020
 
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