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2023 International Electron Devices Meeting (IEDM) ,
2
A Target-Read Retry Scheme for 3D Charge Trap NAND Flash Me..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
5
A Novel Data Recovery Technique for 3D TLC NAND Flash Memor..:
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2020 IEEE Symposium on VLSI Technology ,
10