E-LIB Suche - Ergebnisse für: Chovet, A

1

REALMS: Resilient exploration and lunar mapping system:

van der Meer, D. ; Chovet, L. ; Bera, A....
Frontiers in Robotics and AI. 10 (2023) - p. , 2023

Link: https://doi.org/10.3389/..

2

Physica status solidi

Volume 76, Number 1: March 16 Physica status solidi ; Volume 76, Number 1, A

Adliene, D ; Aeai, T ; Al-Adl, A. I... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

3

Physica status solidi

Volume 71, Number 1: May 16 Physica status solidi ; Volume 71, Number 1, A

Abdullaev, G. B ; Abrikosov, N. Kh ; Ahmed, A. S... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

4

Physica status solidi

Volume 46, Number 1: March 16 Physica status solidi ; Volume 46, Number 1, A

Amelinckx, S ; Andkeev, G. A ; Antonov, V. A... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

5

Physica status solidi

Volume 46, Number 1: March 16 Physica status solidi ; Volume 46, Number 1, A

Andreev, G. A ; Antonov, V. A ; Arsenev, P. A... - Reprint 2021 . , [2021]

Link: https://doi.org/10.1515/..

6

Low frequency noise in GaAs structures with embedded In(Ga)..:

Lee, J.I. ; Nam, H.D. ; Choi, W.J....
Current Applied Physics. 6 (2006) 6 - p. 1024-1029 , 2006

Link: https://doi.org/10.1016/..

7

Low-frequency noise characteristics of InGaAs quantum-dot i..:

Choi, W.J. ; Song, J.D. ; Hwang, S.H....
Physica E: Low-dimensional Systems and Nanostructures. 26 (2005) 1-4 - p. 366-371 , 2005

Link: https://doi.org/10.1016/..

8

Polycrystalline silicon thin films for microsystems: correl..:

Michelutti, L ; Chovet, A ; Stoemenos, J..
Thin Solid Films. 401 (2001) 1-2 - p. 235-242 , 2001

Link: https://doi.org/10.1016/..

9

Influence of chemical corrosion on resistivity and 1/f nois..:

Michelutti, L. ; Mathieu, N. ; Chovet, A..
Microelectronics Reliability. 40 (2000) 1 - p. 179-183 , 2000

Link: https://doi.org/10.1016/..

10

On 1/fγ noise in semiconductor devices:

Lee, J.I ; Brini, J ; Chovet, A.
Solid-State Electronics. 43 (1999) 12 - p. 2181-2183 , 1999

Link: https://doi.org/10.1016/..

11

Sub-band-gap impact ionization events in transient regimes ..:

Ionescu, A.M. ; Chovet, A.
Microelectronic Engineering. 48 (1999) 1-4 - p. 371-374 , 1999

Link: https://doi.org/10.1016/..

12

Flicker noise by random walk of electrons at the interface ..:

Lee, J.I. ; Brini, J. ; Chovet, A..
Solid-State Electronics. 43 (1999) 12 - p. 2185-2189 , 1999

Link: https://doi.org/10.1016/..

13

Extraction method for source series resistance and transver..:

Ionescu, A.M. ; Chovet, A. ; Popescu, A.E...
Microelectronics Reliability. 38 (1998) 5 - p. 753-758 , 1998

Link: https://doi.org/10.1016/..

14

Highly sensitive Hall sensors:

Medico, S Del ; Benyattou, T ; Guillot, G...
Semiconductor Science and Technology. 11 (1996) 4 - p. 576-581 , 1996

Link: https://doi.org/10.1088/..

15

Improved characterization of fully-depleted SOI wafers by p..:

Ionescu, A.M. ; Cristoloveanu, S. ; Wilson, S.R....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 112 (1996) 1-4 - p. 228-232 , 1996

Link: https://doi.org/10.1016/..