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Chuang, Min-Hui
3873  Ergebnisse:
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1

Temperature-Dependent Hydrogen Modulations of Ultra-Scaled ..:

Aslam, Muhammad ; Chang, Shu-Wei ; Chuang, Min-Hui...
IEEE Open Journal of Nanotechnology.  5 (2024)  - p. 9-16 , 2024
Link: https://doi.org/10.1109/..
 
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2

Nanosized-Metal-Grain-Pattern-Dependent Threshold-Voltage M..:

Sung, Wen-Li ; Li, Yiming ; Chuang, Min-Hui
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 350-358 , 2024
Link: https://doi.org/10.1109/..
 
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3

Intrinsic Parameter Fluctuation and Process Variation Effec..:

, In: 2023 24th International Symposium on Quality Electronic Design (ISQED),
Kola, Sekhar Reddy ; Li, Yiming ; Chuang, Min-Hui - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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4

Application of long short-term memory modeling technique to..:

Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy..
Computers and Electrical Engineering.  105 (2023)  - p. 108554 , 2023
Link: https://doi.org/10.1016/..
 
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5

Statistical Analysis of Intrinsic High-Frequency Characteri..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Kola, Sekhar Reddy ; Li, Yiming ; Chuang, Min-Hui.. - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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6

Characteristics Fluctuation of Sub-3-nm Bulk FinFET Devices..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Kola, Sekhar Reddy ; Chuang, Min-Hui ; Li, Yiming - p. 917-922 , 2023
Link: https://doi.org/10.1109/..
 
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7

Electronic Structures of Monolayer Binary and Ternary 2D Ma..:

Chen, Chieh-Yang ; Li, Yiming ; Chuang, Min-Hui
Nanomaterials.  13 (2022)  1 - p. 68 , 2022
Link: https://doi.org/10.3390/..
 
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8

Estimating the Process Variation Effects of Stacked Gate Al..:

, In: 2022 IEEE 22nd International Conference on Nanotechnology (NANO),
Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy.. - p. 170-173 , 2022
Link: https://doi.org/10.1109/..
 
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9

DC Characteristics and Dynamic Properties of Multi-Channel ..:

Chuang, Min-Hui ; Li, Yiming
ECS Journal of Solid State Science and Technology.  11 (2022)  6 - p. 065001 , 2022
Link: https://doi.org/10.1149/..
 
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10

A Unified Statistical Analysis of Comprehensive Fluctuation..:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Kola, Sekhar Reddy ; Li, Yiming ; Chen, Chieh-Yang. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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11

Statistical 3D Device Simulation of Full Fluctuations of Ga..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Kola, Sekhar Reddy ; Li, Yiming ; Chen, Chieh-Yang. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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12

Effects of Random Nanosized TiN Grain on Characteristic of ..:

Li, Yiming ; Chuang, Min-Hui ; Tsai, Yu-Chin
Nanoscale Research Letters.  17 (2022)  1 - p. , 2022
Link: https://doi.org/10.1186/..
 
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13

On the energy band of neutral-beam etched Si/Si0.7Ge0.3 nan..:

Chuang, Min-Hui ; Li, Yiming ; Samukawa, Seiji
Japanese Journal of Applied Physics.  60 (2021)  SB - p. SBBI03 , 2021
Link: https://doi.org/10.35848..
 
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14

Numerical Simulation of Thermal Conductivity of Silicon Nan..:

, In: Scientific Computing in Electrical Engineering; Mathematics in Industry,
Chuang, Min-Hui ; Li, Yiming - p. 63-71 , 2021
Link: https://doi.org/10.1007/..
 
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15

Management of Phonon Transport in Lateral Direction for Gap..:

Ohori, Daisuke ; Chuang, Min-Hui ; Sato, Asahi...
IEEE Open Journal of Nanotechnology.  2 (2021)  - p. 148-152 , 2021
Link: https://doi.org/10.1109/..
 
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