Chubinskiy-Nadezhdin, I. V.
35  Ergebnisse:
Personensuche X
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Scanning ion-conductance and atomic force microscope with s..:

Zhukov, M V ; Sapozhnikov, I D ; Golubok, A O...
Journal of Physics: Conference Series.  917 (2017)  - p. 042022 , 2017
 
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