E-LIB Suche - Ergebnisse für: Chubunov, P.

1

Investigation of Dose and Dose Rate Sensitivity of RADFETs ..:

, In: 2020 Moscow Workshop on Electronic and Networking Technologies (MWENT),

Mrozovskaya, E. V. ; Chubunov, P. A. ; Zebrev, G. I. - p. 1-3 , 2020

2

Calibration and electric characterization of p-MNOS RADFETs..:

Zimin, P.A. ; Mrozovskaya, E.V. ; Chubunov, P.A...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 940 (2019) - p. 307-312 , 2019

Link: https://doi.org/10.1016/..

3

Predicting the No-Failure Microcontroller Operation Probabi..:

Kulikov, N. A. ; Popov, V. D. ; Chubunov, P. A.
Cosmic Research. 56 (2018) 5 - p. 400-404 , 2018

Link: https://doi.org/10.1134/..

4

ELDRS in p-MOS and p-MNOS Based RAD-FETs with Thick Gate In..:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Zimin, P. A. ; Mrozovskaya, E.V. ; Anashin, V. S.... - p. 1-3 , 2018

Link: https://doi.org/10.1109/..

5

Heavy-Ion SEE Test Results for Amplifiers:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Kalashnikova, A. ; Anashin, V. ; Chubunov, P.... - p. 1-5 , 2018

Link: https://doi.org/10.1109/..

6

Calibration and electric characterization of p-MNOS RADFETs..:

Zebrev, G. I ; Zimin, P. A ; Mrozovskaya, E. V..
http://arxiv.org/abs/1906.02118. , 2019

Link: http://arxiv.org/abs/190..

7

Long Term Logarithmic Annealing in p-MNOS RADFETs and Renor..:

Zebrev, G. I ; Zimin, P. A ; Mrozovskaya, E. V...
http://arxiv.org/abs/1906.09215. , 2019

Link: http://arxiv.org/abs/190..

8

Influence of ionizing radiation on the parameters of p-chan..:

Yu. V. Bogatyrev ; D. A. Aharodnikau ; S. B. Lastovsky...
https://vestift.belnauka.by/jour/article/view/767/616. , 2023

Link: https://vestift.belnauka..