Chun-Hsiung Lin
5033  Ergebnisse:
Personensuche X
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1

Low contact resistance and high breakdown voltage of AlGaN/..:

Hieu, Le Trung ; Rathaur, Shivendra K ; Lu, Chee-How...
Semiconductor Science and Technology.  39 (2024)  8 - p. 085006 , 2024
 
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2

Impact of In and Ga Fractions in Lattice-Matched InAlGaN Ba..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
 
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4

Performances Analysis for Core-Shell Si/InxGa1-xAs FinFET:

Lu, Yu-Cheng ; Chen, Kuan-Lun ; Huang, Ping...
IEEE Transactions on Electron Devices.  71 (2024)  8 - p. 4453-4461 , 2024
 
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6

Highly Scaled BEOL-Compatible Thin Film Transistors With Ul..:

Liang, Yan-Kui ; Zheng, Jun-Yang ; Lin, Yu-Lon...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3671-3677 , 2024
 
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8

Effect of Local Substrate Removal and Backside Al Heat Diss..:

Lin, Yuan ; Huang, Hsuan-Yao ; Weng, You-Chen...
ECS Journal of Solid State Science and Technology.  12 (2023)  9 - p. 095005 , 2023
 
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9

High-Quality AlGaN/GaN HEMTs Growth on Silicon Using Al0.07..:

Lee, Tsu-Ting ; Hieu, Le Trung ; Chiang, Chung-Han...
ECS Journal of Solid State Science and Technology.  12 (2023)  10 - p. 105002 , 2023
 
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10

Electrical Characteristics of Ultrathin InZnO Thin-Film Tra..:

Liang, Yan-Kui ; Lin, Jing-Wei ; Peng, Li-Chi...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1067-1072 , 2023
 
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12

Aggressively Scaled Atomic Layer Deposited Amorphous InZnOx..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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13

First Demonstration of Highly Scaled Atomic Layer Deposited..:

, In: 2023 International Electron Devices Meeting (IEDM),
Liang, Yan-Kui ; Zheng, Jun-Yang ; Lin, Yu-Lon... - p. 1-4 , 2023
 
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14

Improved Off-State Leakage Current and Cutoff Frequency for..:

Trung Hieu, Le ; Hsu, Heng-Tung ; Panda, Debashis...
ECS Journal of Solid State Science and Technology.  12 (2023)  2 - p. 025001 , 2023
 
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