Personensuche
X
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm ..:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-Al..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
3
Impact of Design and Process on Alpha-Induced SER in 4 nm B..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
4
Investigating of SER in 28 nm FDSOI-Planar and Comparing wi..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
5