Chung, Chin-Wook
4759  Ergebnisse:
Personensuche X
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2

Effect of aluminum content on plasma resistance and contami..:

So, Jongho ; Choi, Eunmi ; Kim, Minjoong...
Materials Science in Semiconductor Processing.  170 (2024)  - p. 107981 , 2024
 
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3

A harmonic method for measuring electron temperature and io..:

Eo, Hyundong ; Park, Sung Joon ; Kim, Ju Ho.
Plasma Sources Science and Technology.  33 (2024)  2 - p. 025028 , 2024
 
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5

Reduced amount of contamination particle generated by CF4/A..:

Kim, Minjoong ; Choi, Eunmi ; So, Jongho...
Materials Science in Semiconductor Processing.  167 (2023)  - p. 107809 , 2023
 
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6

Effect of parallel resonance on the electron energy distrib..:

HE, You ; LIM, Yeong-Min ; LEE, Jun-Ho...
Plasma Science and Technology.  25 (2023)  4 - p. 045401 , 2023
 
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7

Two-dimensional measurements of the ELM filament using a mu..:

Hong, Young-Hun ; Kim, Kwan-Yong ; Kim, Ju-Ho...
Nuclear Engineering and Technology.  54 (2022)  10 - p. 3717-3723 , 2022
 
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8

Correlation of SiO2 etch rate in CF4 plasma with electrical..:

Lee, Nayeon ; Lee, Woohyun ; Kwon, Ohyung.
Journal of Physics D: Applied Physics.  55 (2022)  37 - p. 375204 , 2022
 
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11

Improvement of corrosion properties of plasma in an aluminu..:

Kim, Minjoong ; Choi, Eunmi ; So, Jongho...
Journal of Materials Research and Technology.  11 (2021)  - p. 219-226 , 2021
 
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15

Degradation Test for an Anodic Aluminum Oxide Film in Plasm..:

Lee, Seung-Su ; Kim, Min-Joong ; Chung, Chin-Wook...
Journal of the Korean Physical Society.  74 (2019)  11 - p. 1046-1051 , 2019
 
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