Ciampolini, L.
541  Ergebnisse:
Personensuche X
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1

An Automated Design Methodology for Computational SRAM Dedi..:

, In: Proceedings of the 24th ACM/IEEE Workshop on System Level Interconnect Pathfinding,
Philippe, A. ; Ciampolini, L. ; Philippe, A.... - p. 1-7 , 2022
 
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4

Reliability and Variability of 1S1R OxRAM-OTS for High Dens..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Robayo, D. Alfaro ; Deleruyelle, D. ; Vianello, E.... - p. 35.3.1-35.3.4 , 2019
 
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5

Back-bias impact on variability and BTI for 3D-monolithic 1..:

, In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),
Bosch, D. ; Andrieu, F. ; Garros, X.... - p. 1-4 , 2019
 
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Novel Fine-Grain Back-Bias Assist Techniques for 14nm FDSOI..:

, In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),
Bosch, D. ; Andrieu, F. ; Ciampolini, L.... - p. 1-2 , 2019
 
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7

Modelling of Boron Trapping at End-of-Range defects in pre-..:

Bazizi, E.M. ; Fazzini, P.F. ; Zechner, C....
Materials Science and Engineering: B.  154-155 (2008)  - p. 275-278 , 2008
 
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9

A new gradient monochromator for the IN13 back-scattering s..:

Ciampolini, L. ; Bove, L.E. ; Mondelli, C....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  544 (2005)  3 - p. 649-658 , 2005
 
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10

Prosthetic joint infection by cat scratch:

J, Ciampolini ; M, Morgan ; J, Timperley
Australian Veterinary Journal.  82 (2004)  11 - p. 696-696 , 2004
 
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11

USING ABDUCTIVE LOGIC AGENTS FOR MODELING THE JUDICIAL EVAL..:

CIAMPOLINI, A. ; TORRONI, P.
Applied Artificial Intelligence.  18 (2004)  3-4 - p. 251-275 , 2004
 
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12

An aid to femoral nail removal:

Ciampolini, J ; Eyres, K.S
Injury.  34 (2003)  3 - p. 229-231 , 2003
 
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13

Simulation of scanning capacitance microscopy measurements ..:

Ciampolini, L. ; Giannazzo, F. ; Ciappa, M...
Materials Science in Semiconductor Processing.  4 (2001)  1-3 - p. 85-88 , 2001
 
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14

Quantification of scanning capacitance microscopy measureme..:

Malberti, P. ; Ciampolini, L. ; Ciappa, M..
Microelectronics Reliability.  40 (2000)  8-10 - p. 1395-1399 , 2000
 
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15

Modelling thermal effects of large contiguous voids in sold..:

Ciampolini, L. ; Ciappa, M. ; Malberti, P...
Microelectronics Journal.  30 (1999)  11 - p. 1115-1123 , 1999
 
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